A simplified model for the effect of interfinger metal on maximum temperature rise in a multifinger bipolar transistor

Walkey, D.J. ; Celo, D. ; Smy, T.J.

IEEE transactions on computer-aided design of integrated circuits and systems, 2003-01, Vol.22 (1), p.15-25 [Periódico revisado por pares]

New York: IEEE

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