Photovoltaic Cell Defect Detection by Lock-In Thermography Using 2-D Gaussian Profile
Vieira, Thiago Mota ; Santana, Ezio C. ; Ferreira, Tarso V. ; Riffel, Douglas B.
IEEE journal of photovoltaics, 2024-05, Vol.14 (3), p.480-487 [Periódico revisado por pares]Piscataway: IEEE
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