Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
Vandemaele, Michiel ; Groeseneken, Guido ; Kaczer, Ben ; Bury, Erik ; Chasin, Adrian ; Francop, Jacopo ; Mertens, Hans ; Makarov, Alexander ; Hellings, Geert ; Tyaginov, Stanislav
IEEE 2022
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