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Device characteristics of high-Tc superconducting terahertz emitters evaluated by using a thermoreflectance microscopy method

Kashiwagi, T. ; Tanaka, T. ; Watanabe, C. ; Komori, Y. ; Tanabe, Y. ; Yuasa, T. ; Ota, R. ; Kuwano, G. ; Nakamura, K. ; Imai, T. ; Ono, Y. ; Kaneko, Y. ; Tsujimoto, M. ; Yamamoto, T. ; Minami, H. ; Kadowaki, K.

Meeting Abstracts of the Physical Society of Japan, 2018, pp.1890-1890

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Título:
Device characteristics of high-Tc superconducting terahertz emitters evaluated by using a thermoreflectance microscopy method
Autor: Kashiwagi, T. ; Tanaka, T. ; Watanabe, C. ; Komori, Y. ; Tanabe, Y. ; Yuasa, T. ; Ota, R. ; Kuwano, G. ; Nakamura, K. ; Imai, T. ; Ono, Y. ; Kaneko, Y. ; Tsujimoto, M. ; Yamamoto, T. ; Minami, H. ; Kadowaki, K.
É parte de: Meeting Abstracts of the Physical Society of Japan, 2018, pp.1890-1890
Notas: 22aK404-9
Editor: The Physical Society of Japan
Idioma: Japonês

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