Experimental Study of Fault Injection Attack on Image Sensor Interface for Triggering Backdoored DNN Models
OYAMA, Tatsuya ; OKURA, Shunsuke ; YOSHIDA, Kota ; FUJINO, Takeshi
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, 2022/03/01, Vol.E105.A(3), pp.336-343 [Periódico revisado por pares]Tokyo: The Institute of Electronics, Information and Communication Engineers
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