Direct sample positioning and alignment methodology for strain measurement by diffraction

Ratel, N. ; Hughes, D. J. ; King, A. ; Malard, B. ; Chen, Z. ; Busby, P. ; Webster, P. J.

Review of scientific instruments, 2005-05, Vol.76 (5), p.055103-055103-5 [Periódico revisado por pares]

United States: American Institute of Physics

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