The DESI instrument control systems: status and early testing

Honscheid, K ; Elliott, A. E ; Buckley-Geer, E ; Abreshi, B ; Castander, F ; da Costa, L ; Kent, S ; Kirkby, D ; Marshall, R ; Neilsen, E ; Ogando, R ; Rabinowitz, D ; Roodman, A ; Serrano, S ; Brooks, D ; Levi, M ; Tarle, G Ibsen, Jorge ; Guzman, Juan C

Proceedings of SPIE, the international society for optical engineering, 2018, Vol.10707, p.107071D-107071D-12

United States: SPIE

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