Deep Insights into Recessed Gate MOS-HEMT Technology for Power Applications

Mohamad, B. ; Royer, C. Le ; Rigaud-Minet, F. ; Piotrowicz, C. ; Paes Pinto Rocha, P. Fernandes ; Leurquin, C. ; Vandendaele, W. ; Escoffier, R. ; Buckley, J. ; Becu, S. ; Biscarrat, J. ; Gwoziecki, R.

2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2023, p.1-3

IEEE

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