Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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11 |
Material Type: Ata de Congresso
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Laser Fault Attack on Physically Unclonable FunctionsTajik, Shahin ; Ganji, Fatemeh ; Seifert, Jean-Pierre ; Lohrke, Heiko ; Boit, Christian2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 2015, p.85-96IEEETexto completo disponível |
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12 |
Material Type: Ata de Congresso
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Improving Fault Attacks on Embedded Software Using RISC Pipeline CharacterizationYuce, Bilgiday ; Ghalaty, Nahid Farhady ; Schaumont, Patrick2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 2015, p.97-108IEEETexto completo disponível |
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13 |
Material Type: Ata de Congresso
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Multi-task Learning for one-class classificationHaiqin Yang ; King, Irwin ; Lyu, Michael RThe 2010 International Joint Conference on Neural Networks (IJCNN), 2010, p.1-8IEEETexto completo disponível |
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14 |
Material Type: Ata de Congresso
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Data-driven haptics: Addressing inhomogeneities and computational formulationSianov, A. ; Harders, M.2013 World Haptics Conference (WHC), 2013, p.301-306IEEETexto completo disponível |
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15 |
Material Type: Artigo
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iJADE stock advisor: an intelligent agent based stock prediction system using hybrid RBF recurrent networkLee, R.S.T.IEEE transactions on systems, man and cybernetics. Part A, Systems and humans, 2004-05, Vol.34 (3), p.421-428New York: IEEETexto completo disponível |
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16 |
Material Type: Ata de Congresso
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Underfill delamination to chip sidewall in advanced flip chip packagesPaquet, M.-C. ; Sylvestre, J. ; Gros, E. ; Boyer, N.2009 59th Electronic Components and Technology Conference, 2009, p.960-965IEEETexto completo disponível |
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17 |
Material Type: Ata de Congresso
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Waseda Bioinstrumentation system WB-2R as a wearable tool for an objective analysis of surgeon's performanceZhuohua Lin ; Zecca, M. ; Sessa, S. ; Kusano, T. ; Itoh, K. ; Takanishi, A.2009 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2009, p.705-710IEEETexto completo disponível |
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18 |
Material Type: Capítulo de Livro
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ExtensionsKlir, George J ; Wang, ZhenyuanGeneralized Measure Theory, 2009, Vol.25, p.111-132United States: SpringerTexto completo disponível |
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19 |
Material Type: Artigo
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Programmed Grammars and Classes of Formal LanguagesRosenkrantz, DanielJournal of the ACM, 1969-01, Vol.16 (1), p.107-131 [Periódico revisado por pares]ACMTexto completo disponível |
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20 |
Material Type: magazinearticle
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Skill evaluationSrikant, Shashank ; Takhar, Rohit ; Venugopal, Vishal ; Aggarwal, VarunCommunications of the ACM, 2019-11, Vol.62 (11), p.60-61New York: ACMTexto completo disponível |