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Material Type: Artigo
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The Soil Moisture Active Passive Experiments: Validation of the SMAP Products in AustraliaYe, Nan ; Walker, Jeffrey P. ; Wu, Xiaoling ; de Jeu, Richard ; Gao, Ying ; Jackson, Thomas J. ; Jonard, Francois ; Kim, Edward ; Merlin, Olivier ; Pauwels, Valentijn R. N. ; Renzullo, Luigi J. ; Rudiger, Christoph ; Sabaghy, Sabah ; von Hebel, Christian ; Yueh, Simon H. ; Zhu, LiujunIEEE transactions on geoscience and remote sensing, 2021-04, Vol.59 (4), p.2922-2939 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Calibration, Conversion, and Quantitative Multi-Layer Inversion of Multi-Coil Rigid-Boom Electromagnetic Induction Datavon Hebel, Christian ; van der Kruk, Jan ; Huisman, Johan A ; Mester, Achim ; Altdorff, Daniel ; Endres, Anthony L ; Zimmermann, Egon ; Garré, Sarah ; Vereecken, HarrySensors (Basel, Switzerland), 2019-11, Vol.19 (21), p.4753 [Periódico revisado por pares]Switzerland: MDPI AGTexto completo disponível |
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Material Type: Artigo
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Estimation of Vegetation Structure Parameters From SMAP Radar Intensity ObservationsJagdhuber, Thomas ; Montzka, Carsten ; Lopez-Martinez, Carlos ; Baur, Martin J. ; Link, Moritz ; Piles, Maria ; Das, Narendra Narayan ; Jonard, FrancoisIEEE transactions on geoscience and remote sensing, 2021-01, Vol.59 (1), p.151-167 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Inter-Comparison of Proximal Near-Surface Soil Moisture Measurement TechniquesWu, Xiaoling ; Walker, Jeffrey P. ; Jonard, Francois ; Ye, NanIEEE journal of selected topics in applied earth observations and remote sensing, 2022, Vol.15, p.2370-2378 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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Material Type: Artigo
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Estimation of Hydraulic Properties of a Sandy Soil Using Ground-Based Active and Passive Microwave Remote SensingJonard, Francois ; Weihermuller, Lutz ; Schwank, Mike ; Jadoon, Khan Zaib ; Vereecken, Harry ; Lambot, SebastienIEEE transactions on geoscience and remote sensing, 2015-06, Vol.53 (6), p.3095-3109 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Brightness Temperature and Soil Moisture Validation at Different Scales During the SMOS Validation Campaign in the Rur and Erft Catchments, GermanyMontzka, C. ; Bogena, H. R. ; Weihermuller, L. ; Jonard, F. ; Bouzinac, C. ; Kainulainen, J. ; Balling, J. E. ; Loew, A. ; dall'Amico, J. T. ; Rouhe, E. ; Vanderborght, J. ; Vereecken, H.IEEE transactions on geoscience and remote sensing, 2013-03, Vol.51 (3), p.1728-1743 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Phase-change materials for non-volatile memory devices: from technological challenges to materials science issuesNoé, Pierre ; Vallée, Christophe ; Hippert, Françoise ; Fillot, Frédéric ; Raty, Jean-YvesSemiconductor science and technology, 2018-01, Vol.33 (1), p.13002 [Periódico revisado por pares]IOP PublishingTexto completo disponível |
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Material Type: Artigo
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Soil Surface Water Content Estimation by Full-Waveform GPR Signal Inversion in the Presence of Thin LayersMinet, J. ; Lambot, S. ; Slob, E.C. ; Vanclooster, M.IEEE transactions on geoscience and remote sensing, 2010-03, Vol.48 (3), p.1138-1150 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Empirical Removal of Tides and Inverse Barometer Effect on DInSAR From Double DInSAR and a Regional Climate ModelGlaude, Quentin ; Amory, Charles ; Berger, Sophie ; Derauw, Dominique ; Pattyn, Frank ; Barbier, Christian ; Orban, AnneIEEE journal of selected topics in applied earth observations and remote sensing, 2020-01, Vol.13, p.4085-4094 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
10 |
Material Type: Artigo
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Mapping Field-Scale Soil Moisture With L-Band Radiometer and Ground-Penetrating Radar Over Bare SoilJonard, F. ; Weihermuller, L. ; Jadoon, K. Z. ; Schwank, M. ; Vereecken, H. ; Lambot, S.IEEE transactions on geoscience and remote sensing, 2011-08, Vol.49 (8), p.2863-2875 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |