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Refinado por: Base de dados/Biblioteca: IEEE Electronic Library (IEL) Journals remover Nome da Publicação: Ieee Transactions On Nuclear Science remover
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11
The AMchip: a full-custom CMOS VLSI associative memory for pattern recognition
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The AMchip: a full-custom CMOS VLSI associative memory for pattern recognition

Amendolia, S.R. ; Galeotti, S. ; Morsani, F. ; Passuello, D. ; Ristori, L. ; Sciacca, G. ; Turini, N.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-08, Vol.39 (4), p.795-797 [Periódico revisado por pares]

NEW YORK: IEEE

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12
Amorphous silicon position sensitive neutron detector
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Amorphous silicon position sensitive neutron detector

Mireshghi, A. ; Cho, G. ; Drewery, J. ; Jing, T. ; Kaplan, S.N. ; Perez-Mendez, V. ; Wildermuth, D.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-08, Vol.39 (4), p.635-640 [Periódico revisado por pares]

NEW YORK: IEEE

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13
Proton-induced radiation damage in germanium detectors
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Proton-induced radiation damage in germanium detectors

Bruckner, J. ; Korfer, M. ; Wanke, H. ; Schroeder, A.N.F. ; Filges, D. ; Dragovitsch, P. ; Englert, P.A.J. ; Starr, R. ; Trombka, J.I. ; Taylor, I. ; Drake, D.M. ; Shunk, E.R.

IEEE transactions on nuclear science, 1991-04, Vol.38 (2), p.209-217 [Periódico revisado por pares]

Legacy CDMS: IEEE

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14
An improved multicrystal 2-D BGO detector for PET
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An improved multicrystal 2-D BGO detector for PET

Rogers, J.G. ; Taylor, A.J. ; Rahimi, M.F. ; Nutt, R. ; Andreaco, M. ; Williams, C.W.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-08, Vol.39 (4), p.1063-1068 [Periódico revisado por pares]

NEW YORK: IEEE

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15
A new integrated pixel detector for high energy physics
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A new integrated pixel detector for high energy physics

Snoeys, W. ; Plummer, J. ; Parker, S. ; Kenney, C.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-10, Vol.39 (5), p.1263-1269 [Periódico revisado por pares]

NEW YORK: IEEE

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16
A cross-validation procedure for stopping the EM algorithm and deconvolution of neutron depth profiling spectra
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A cross-validation procedure for stopping the EM algorithm and deconvolution of neutron depth profiling spectra

Coakley, K.J.

IEEE transactions on nuclear science, 1991-02, Vol.38 (1), p.9-15 [Periódico revisado por pares]

New York, NY: IEEE

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17
Fast neutron radiation effects in silicon detectors fabricated by different thermal oxidation processes
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Fast neutron radiation effects in silicon detectors fabricated by different thermal oxidation processes

Li, Z. ; Kraner, H.W.

IEEE transactions on nuclear science, 1992-08, Vol.39 (4), p.577-583 [Periódico revisado por pares]

NEW YORK: IEEE

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18
Understanding effect of Teflon room temperature phase transition on coax cable delay in order to improve the measurement of TE signals of deuterated polarized targets
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Understanding effect of Teflon room temperature phase transition on coax cable delay in order to improve the measurement of TE signals of deuterated polarized targets

Dhawan, S.K.

IEEE transactions on nuclear science, 1992-10, Vol.39 (5), p.1331-1335 [Periódico revisado por pares]

NEW YORK: IEEE

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19
Effect of new cross section evaluations on neutron spectrum determination
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Effect of new cross section evaluations on neutron spectrum determination

Griffin, P.J. ; Kelly, J.G. ; Luera, T.F. ; VanDenburg, J.

IEEE transactions on nuclear science, 1992-12, Vol.39 (6), p.2078-2085 [Periódico revisado por pares]

NEW YORK: IEEE

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20
Development of a monolithic constant fraction discriminator
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Development of a monolithic constant fraction discriminator

Tanaka, M. ; Ikeda, H. ; Ikeda, M. ; Inaba, S.

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1992-10, Vol.39 (5), p.1321-1325 [Periódico revisado por pares]

NEW YORK: IEEE

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