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Prioritizing Test Inputs for Deep Neural Networks via Mutation AnalysisWang, Zan ; You, Hanmo ; Chen, Junjie ; Zhang, Yingyi ; Dong, Xuyuan ; Zhang, Wenbin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.397-409IEEETexto completo disponível |
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Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Fault Localization with Code Coverage Representation LearningLi, Yi ; Wang, Shaohua ; Nguyen, Tien2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.661-673IEEETexto completo disponível |
14 |
Material Type: Ata de Congresso
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Semi-Supervised Log-Based Anomaly Detection via Probabilistic Label EstimationYang, Lin ; Chen, Junjie ; Wang, Zan ; Wang, Weijing ; Jiang, Jiajun ; Dong, Xuyuan ; Zhang, Wenbin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1448-1460IEEETexto completo disponível |
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Material Type: Ata de Congresso
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SmartCheck: static analysis of ethereum smart contractsTikhomirov, Sergei ; Voskresenskaya, Ekaterina ; Ivanitskiy, Ivan ; Takhaviev, Ramil ; Marchenko, Evgeny ; Alexandrov, Yaroslav2018 IEEE/ACM 1st International Workshop on Emerging Trends in Software Engineering for Blockchain (WETSEB), 2018, p.9-16New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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DeepRoad: GAN-based metamorphic testing and input validation framework for autonomous driving systemsZhang, Mengshi ; Zhang, Yuqun ; Zhang, Lingming ; Liu, Cong ; Khurshid, Sarfraz2018 33rd IEEE/ACM International Conference on Automated Software Engineering (ASE), 2018, p.132-142New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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RobOT: Robustness-Oriented Testing for Deep Learning SystemsWang, Jingyi ; Chen, Jialuo ; Sun, Youcheng ; Ma, Xingjun ; Wang, Dongxia ; Sun, Jun ; Cheng, Peng2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.300-311IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Deep code comment generationHu, Xing ; Li, Ge ; Xia, Xin ; Lo, David ; Jin, Zhi2018 IEEE/ACM 26th International Conference on Program Comprehension (ICPC), 2018, p.200-210New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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Testing autonomous cars for feature interaction failures using many-objective searchAbdessalem, Raja Ben ; Panichella, Annibale ; Nejati, Shiva ; Briand, Lionel C. ; Stifter, Thomas2018 33rd IEEE/ACM International Conference on Automated Software Engineering (ASE), 2018, p.143-154New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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AUTOTRAINER: An Automatic DNN Training Problem Detection and Repair SystemZhang, Xiaoyu ; Zhai, Juan ; Ma, Shiqing ; Shen, Chao2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.359-371IEEETexto completo disponível |