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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Analysis and design of terahertz antennas based on plasmonic resonant graphene sheetsTamagnone, M. ; Gómez-Díaz, J. S. ; Mosig, J. R. ; Perruisseau-Carrier, J.Journal of applied physics, 2012-12, Vol.112 (11) [Periódico revisado por pares]United StatesTexto completo disponível |
| 2 |
Material Type: Artigo
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Quantum networks based on color centers in diamondRuf, Maximilian ; Wan, Noel H. ; Choi, Hyeongrak ; Englund, Dirk ; Hanson, RonaldJournal of applied physics, 2021-08, Vol.130 (7) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 3 |
Material Type: Artigo
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Nanoscale magnetophotonicsMaccaferri, Nicolò ; Zubritskaya, Irina ; Razdolski, Ilya ; Chioar, Ioan-Augustin ; Belotelov, Vladimir ; Kapaklis, Vassilios ; Oppeneer, Peter M. ; Dmitriev, AlexandreJournal of applied physics, 2020-02, Vol.127 (8), p.080903 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 4 |
Material Type: Artigo
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Perspective: Magnetic skyrmions—Overview of recent progress in an active research fieldEverschor-Sitte, K. ; Masell, J. ; Reeve, R. M. ; Kläui, M.Journal of applied physics, 2018-12, Vol.124 (24) [Periódico revisado por pares]Texto completo disponível |
| 5 |
Material Type: Artigo
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Defect-reduction mechanism for improving radiative efficiency in InGaN/GaN light-emitting diodes using InGaN underlayersArmstrong, Andrew M. ; Bryant, Benjamin N. ; Crawford, Mary H. ; Koleske, Daniel D. ; Lee, Stephen R. ; Wierer, Jonathan J.Journal of applied physics, 2015-04, Vol.117 (13) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 6 |
Material Type: Artigo
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Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vaporHolloway, Christopher L. ; Simons, Matt T. ; Gordon, Joshua A. ; Dienstfrey, Andrew ; Anderson, David A. ; Raithel, GeorgJournal of applied physics, 2017-06, Vol.121 (23) [Periódico revisado por pares]Texto completo disponível |
| 7 |
Material Type: Artigo
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Diffusion lengths of silicon solar cells from luminescence imagesWürfel, P. ; Trupke, T. ; Puzzer, T. ; Schäffer, E. ; Warta, W. ; Glunz, S. W.Journal of applied physics, 2007-06, Vol.101 (12), p.123110-123110-10 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
| 8 |
Material Type: Artigo
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Effect of valence electron concentration on stability of fcc or bcc phase in high entropy alloysGuo, Sheng ; Ng, Chun ; Lu, Jian ; Liu, C. T.Journal of applied physics, 2011-05, Vol.109 (10), p.103505-103505-5 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
| 9 |
Material Type: Artigo
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3D nanoprinting via focused electron beamsWinkler, R. ; Fowlkes, J. D. ; Rack, P. D. ; Plank, H.Journal of applied physics, 2019-06, Vol.125 (21) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 10 |
Material Type: Artigo
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Inverse geometry for grating-based x-ray phase-contrast imagingDonath, Tilman ; Chabior, Michael ; Pfeiffer, Franz ; Bunk, Oliver ; Reznikova, Elena ; Mohr, Juergen ; Hempel, Eckhard ; Popescu, Stefan ; Hoheisel, Martin ; Schuster, Manfred ; Baumann, Joachim ; David, ChristianJournal of applied physics, 2009-09, Vol.106 (5), p.054703-054703-7 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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