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Microelectronics And Reliability
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| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Artigo
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Threshold voltage instability of nanoscale charge trapping non-volatile memory at steady phaseLee, Meng Chuan ; Wong, Hin Yong ; Lee, LiniMicroelectronics and reliability, 2014-11, Vol.54 (11), p.2392-2395 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 2 |
Material Type: Artigo
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A review: On the development of low melting temperature Pb-free soldersKotadia, Hiren R. ; Howes, Philip D. ; Mannan, Samjid H.Microelectronics and reliability, 2014-06, Vol.54 (6-7), p.1253-1273 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 3 |
Material Type: Artigo
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Failure and reliability analysis of STT-MRAMZhao, W.S. ; Zhang, Y. ; Devolder, T. ; Klein, J.O. ; Ravelosona, D. ; Chappert, C. ; Mazoyer, P.Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.1848-1852 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 4 |
Material Type: Artigo
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GaN HEMT reliabilitydel Alamo, J.A. ; Joh, J.Microelectronics and reliability, 2009-09, Vol.49 (9), p.1200-1206 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 5 |
Material Type: Artigo
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Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilitiesGrasser, TiborMicroelectronics and reliability, 2012, Vol.52 (1), p.39-70 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 6 |
Material Type: Artigo
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Revisiting MOSFET threshold voltage extraction methodsOrtiz-Conde, Adelmo ; García-Sánchez, Francisco J. ; Muci, Juan ; Terán Barrios, Alberto ; Liou, Juin J. ; Ho, Ching-SungMicroelectronics and reliability, 2013-01, Vol.53 (1), p.90-104 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 7 |
Material Type: Artigo
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Development of high-temperature solders: ReviewZeng, Guang ; McDonald, Stuart ; Nogita, KazuhiroMicroelectronics and reliability, 2012-07, Vol.52 (7), p.1306-1322 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 8 |
Material Type: Artigo
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Tunnel FET technology: A reliability perspectiveDatta, Suman ; Liu, Huichu ; Narayanan, VijaykrishnanMicroelectronics and reliability, 2014-05, Vol.54 (5), p.861-874 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
| 9 |
Material Type: Artigo
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Growth mechanism of intermetallic compounds and damping properties of Sn-Ag-Cu-1 wt% nano-ZrO2 composite soldersASIT KUMAR GAIN ; CHAN, Y. CMicroelectronics and reliability, 2014-05, Vol.54 (5), p.945-955 [Periódico revisado por pares]Kidlington: ElsevierTexto completo disponível |
| 10 |
Material Type: Artigo
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Remaining useful life prediction of lithium batteries in calendar ageing for automotive applicationsEddahech, A. ; Briat, O. ; Woirgard, E. ; Vinassa, J.M.Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2438-2442 [Periódico revisado por pares]Kidlington: Elsevier LtdTexto completo disponível |
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