Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Supercritical parametric wave phase conjugation as an instrument for narrowband analysis in ultrasonic harmonic imagingKrutyansky, L. ; Pernod, P. ; Brysev, A. ; Bunkin, F.V. ; Preobrazhensky, V.IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2002-04, Vol.49 (4), p.409-414 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Efficient Volume Reconstruction for Parallel-Beam Computed Laminography by Filtered Backprojection on Multi-Core ClustersMyagotin, Anton ; Voropaev, Alexey ; Helfen, Lukas ; Hanschke, Daniel ; Baumbach, TiloIEEE transactions on image processing, 2013-12, Vol.22 (12), p.5348-5361 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Two-Dimensional Radar Backscattering Modeling of Oil Slicks at Sea Based on the Model of Local Balance: Validation of Two Asymptotic Techniques for Thick FilmsPinel, Nicolas ; Bourlier, Christophe ; Sergievskaya, IrinaIEEE transactions on geoscience and remote sensing, 2014-05, Vol.52 (5), p.2326-2338 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Dielectric and piezoelectric properties of PbFe1/2Nb1/2O3-PbTiO3 ceramics from the morphotropic phase boundary compositional rangeSitalo, E. I. ; Raevski, I. P. ; Lutokhin, A. G. ; Blazhevich, A. V. ; Kubrin, S. P. ; Raevskaya, S. I. ; Zakharov, Y. N. ; Malitskaya, M. A. ; Titov, V. V. ; Zakharchenko, I. N.IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2011-09, Vol.58 (9), p.1914-1919 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Enhanced Plasma Wave Detection of Terahertz Radiation Using Multiple High Electron-Mobility Transistors Connected in SeriesElkhatib, T.A. ; Kachorovskii, V.Y. ; Stillman, W.J. ; Veksler, D.B. ; Salama, K.N. ; Xi-Cheng Zhang ; Shur, M.S.IEEE transactions on microwave theory and techniques, 2010-02, Vol.58 (2), p.331-339 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Dielectric and Mossbauer studies of ferroelectric and magnetic phase transitions in a-site and b-site substituted multiferroic PbFe0.5Nb0.5O3Raevski, I. P. ; Kubrin, S. P. ; Raevskaya, S. I. ; Prosandeev, S. A. ; Malitskaya, M. A. ; Titov, V. V. ; Sarychev, D. A. ; Blazhevich, A. V. ; Zakharchenko, I. N.IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2012-09, Vol.59 (9), p.1872-1878 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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Planning 3-D Collision-Free Dynamic Robotic Motion Through Iterative ReshapingYoshida, E. ; Esteves, C. ; Belousov, I. ; Laumond, J.-P. ; Sakaguchi, T. ; Yokoi, K.IEEE transactions on robotics, 2008-10, Vol.24 (5), p.1186-1198 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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Material Type: Artigo
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CW Ka-Band Kilowatt-Level Helical-Waveguide Gyro-TWTSamsonov, S. V. ; Denisov, G. G. ; Gachev, I. G. ; Eremeev, A. G. ; Fiks, A. S. ; Kholoptsev, V. V. ; Kalynova, G. I. ; Manuilov, V. N. ; Mishakin, S. V. ; Sokolov, E. V.IEEE transactions on electron devices, 2012-08, Vol.59 (8), p.2250-2255 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
9 |
Material Type: Artigo
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Microwave-tomographic imaging of the high dielectric-contrast objects using different image-reconstruction approachesSemenov, S.Y. ; Bulyshev, A.E. ; Abubakar, A. ; Posukh, V.G. ; Sizov, Y.E. ; Souvorov, A.E. ; van den Berg, P.M. ; Williams, T.C.IEEE transactions on microwave theory and techniques, 2005-07, Vol.53 (7), p.2284-2294 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
10 |
Material Type: Artigo
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Non-uniform carrier accumulation in optical confinement layer as ultimate power limitation in ultra-high-power broad-waveguide pulsed InGaAs/GaAs/AlGaAs laser diodesRYVKIN, B ; AVRUTIN, EElectronics letters, 2006-10, Vol.42 (22), p.1283-1284 [Periódico revisado por pares]London: Institution of Electrical EngineersSem texto completo |