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Refinado por: Nome da Publicação: Applied Physics Letters remover idioma: Japonês remover nível superior: Revistas revisadas por pares remover
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Measurements of thermoelectric figure of merit based on multi-harmonic thermal analysis of thermographic images
Measurements of thermoelectric figure of merit based on multi-harmonic thermal analysis of thermographic images
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Measurements of thermoelectric figure of merit based on multi-harmonic thermal analysis of thermographic images

Alasli, Abdulkareem ; Hirai, Takamasa ; Nagano, Hosei ; Uchida, Ken-ichi

Applied physics letters, 2022-10, Vol.121 (15) [Periódico revisado por pares]

Melville: American Institute of Physics

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2
High-performance graphene/InSb heterojunction photodetectors for high-resolution mid-infrared image sensors
High-performance graphene/InSb heterojunction photodetectors for high-resolution mid-infrared image sensors
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High-performance graphene/InSb heterojunction photodetectors for high-resolution mid-infrared image sensors

Shimatani, Masaaki ; Fukushima, Shoichiro ; Okuda, Satoshi ; Ogawa, Shinpei

Applied physics letters, 2020-10, Vol.117 (17) [Periódico revisado por pares]

Melville: American Institute of Physics

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3
Image force microscopy of molecular resonance: A microscope principle
Image force microscopy of molecular resonance: A microscope principle
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Image force microscopy of molecular resonance: A microscope principle

Rajapaksa, I. ; Uenal, K. ; Wickramasinghe, H. Kumar

Applied physics letters, 2010-08, Vol.97 (7), p.073121-073121-3 [Periódico revisado por pares]

United States: American Institute of Physics

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4
Machine learning-based multidomain processing for texture-based image segmentation and analysis
Machine learning-based multidomain processing for texture-based image segmentation and analysis
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Machine learning-based multidomain processing for texture-based image segmentation and analysis

Borodinov, Nikolay ; Tsai, Wan-Yu ; Korolkov, Vladimir V. ; Balke, Nina ; Kalinin, Sergei V. ; Ovchinnikova, Olga S.

Applied physics letters, 2020-01, Vol.116 (4) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Large area strain analysis using scanning transmission electron microscopy across multiple images
Large area strain analysis using scanning transmission electron microscopy across multiple images
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Large area strain analysis using scanning transmission electron microscopy across multiple images

Oni, A. A. ; Sang, X. ; Raju, S. V. ; Dumpala, S. ; Broderick, S. ; Kumar, A. ; Sinnott, S. ; Saxena, S. ; Rajan, K. ; LeBeau, J. M.

Applied physics letters, 2015-01, Vol.106 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

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6
Strain measurement of a channel between Si/Ge stressors in a tri-gate field effect transistor utilizing moiré fringes in scanning transmission microscope images
Strain measurement of a channel between Si/Ge stressors in a tri-gate field effect transistor utilizing moiré fringes in scanning transmission microscope images
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Strain measurement of a channel between Si/Ge stressors in a tri-gate field effect transistor utilizing moiré fringes in scanning transmission microscope images

Kondo, Y. ; Aoyama, Y. ; Hashiguchi, H. ; Lin, C. C. ; Hsu, K. ; Endo, N. ; Asayama, K. ; Fukunaga, K-I.

Applied physics letters, 2019-04, Vol.114 (17) [Periódico revisado por pares]

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7
Energy transport analysis in a Ga0.84In0.16N/GaN heterostructure using microscopic Raman images employing simultaneous coaxial irradiation of two lasers
Energy transport analysis in a Ga0.84In0.16N/GaN heterostructure using microscopic Raman images employing simultaneous coaxial irradiation of two lasers
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Energy transport analysis in a Ga0.84In0.16N/GaN heterostructure using microscopic Raman images employing simultaneous coaxial irradiation of two lasers

Okamoto, Shungo ; Saito, Naomichi ; Ito, Kotaro ; Ma, Bei ; Morita, Ken ; Iida, Daisuke ; Ohkawa, Kazuhiro ; Ishitani, Yoshihiro

Applied physics letters, 2020-04, Vol.116 (14) [Periódico revisado por pares]

Melville: American Institute of Physics

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8
AI-enabled high-resolution scanning coherent diffraction imaging
AI-enabled high-resolution scanning coherent diffraction imaging
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AI-enabled high-resolution scanning coherent diffraction imaging

Cherukara, Mathew J. ; Zhou, Tao ; Nashed, Youssef ; Enfedaque, Pablo ; Hexemer, Alex ; Harder, Ross J. ; Holt, Martin V.

Applied physics letters, 2020-07, Vol.117 (4) [Periódico revisado por pares]

Melville: American Institute of Physics

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9
The origins of polarimetric image contrast between healthy and cancerous human colon tissue
The origins of polarimetric image contrast between healthy and cancerous human colon tissue
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The origins of polarimetric image contrast between healthy and cancerous human colon tissue

Novikova, T. ; Pierangelo, A. ; Manhas, S. ; Benali, A. ; Validire, P. ; Gayet, B. ; De Martino, A.

Applied physics letters, 2013-06, Vol.102 (24) [Periódico revisado por pares]

American Institute of Physics

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10
Carrier de-smearing of photoluminescence images on silicon wafers using the continuity equation
Carrier de-smearing of photoluminescence images on silicon wafers using the continuity equation
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Carrier de-smearing of photoluminescence images on silicon wafers using the continuity equation

Phang, S P ; Sio, H C ; Macdonald, D

Applied physics letters, 2013-11, Vol.103 (19), p.192112 [Periódico revisado por pares]

Melville: American Institute of Physics

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