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Transfer learning for face anti-spoofing detectionVerissimo, Sandoval ; Gadelha, Guilherme ; Batista, Leonardo ; Janduy, Joao ; Falcao, FabioRevista IEEE América Latina, 2023-04, Vol.21 (4), p.530-536Los Alamitos: IEEETexto completo disponível |
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Mangrove semantic segmentation on aerial imagesArias-Aguilar, Jose Anibal ; Lopez-Jimenez, Efren ; Ramirez-Cardenas, Oscar D. ; Herrera-Lozada, J. Carlos ; Hevia-Montiel, NidiyareRevista IEEE América Latina, 2024-05, Vol.22 (5), p.379-386Los Alamitos: IEEETexto completo disponível |
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Simplifying VGG-16 for Plant Species IdentificationCampos-Leal, Juan Augusto ; Yee-Rendon, Arturo ; Vega-Lopez, Ines FernandoRevista IEEE América Latina, 2022-11, Vol.20 (11), p.2330-2338Los Alamitos: IEEETexto completo disponível |
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Fine-grained geometric shapes: A deep classification taskDiaz-Ramirez, Jorge ; Alvarez-Alvarez, Fabrizio ; Badilla-Torrico, XimenaRevista IEEE América Latina, 2022-07, Vol.20 (7), p.1051-1057Los Alamitos: IEEETexto completo disponível |
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An Assessment of the Effectiveness of Pretrained Neural Networks for Malware DetectionMalvacio, Eduardo Martin ; Duarte, Julio CesarRevista IEEE América Latina, 2023-01, Vol.21 (1), p.47-53Los Alamitos: IEEETexto completo disponível |
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Transfer Learning applied to a Classification Task: a Case Study in the Footwear IndustryBloedorn, Fernando Gabriel ; Webber, Carine GeltrudesRevista IEEE América Latina, 2023-03, Vol.21 (3), p.427-433Los Alamitos: IEEETexto completo disponível |
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Material Type: Artigo
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Pollen Grains Classification with a Deep Learning System GPU-TrainedOrtega Cisneros, Susana ; Ruiz Varela, Juan Manuel ; Rivera Acosta, Miguel Angel ; Rivera Dominguez, Jorge ; Moreno Villalobos, PabloRevista IEEE América Latina, 2022-01, Vol.20 (1), p.22-31Los Alamitos: IEEETexto completo disponível |
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Material Type: Artigo
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Classifying COVID-19 positive X-ray using deep learning modelsRodrigues, Iago ; Santos, Guto Leoni ; Sadok, Djamel F.H. ; Endo, Patricia TakakoRevista IEEE América Latina, 2021-06, Vol.19 (6), p.884-892Los Alamitos: IEEETexto completo disponível |
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Material Type: Artigo
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Statistical Analysis Using PLS of a Project-Based Learning Application in Electrical EngineeringSeman, Laio Oriel ; Gomes, Giancarlo ; Hausmann, RomeuRevista IEEE América Latina, 2016-02, Vol.14 (2), p.646-651Los Alamitos: IEEETexto completo disponível |