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1
Two-dimensional x-ray diffraction
Two-dimensional x-ray diffraction
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Livro 		Adicionar ao Meu Espaço

Two-dimensional x-ray diffraction

Bob B. He 1954-

Hoboken, N.J. Wiley c2009

Item não circula. Consulte sua biblioteca.(Acessar)

2
High resolution x-ray diffraction and imaging
High resolution x-ray diffraction and imaging
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High resolution x-ray diffraction and imaging

Biennial Conference on High Resolution X-ray Diffraction and Imaging (9th 2008 Linz, Austria) Julian Stangl; G Bauer

Physica Status Solidi A v.206, n.8, 2009

Bristol, UK Institute of Physics Pub. 2009

Localização: IF - Instituto de Física    (Phys.Status Solidi A v.206(8) )(Acessar)

3
Computer simulation tools for x-ray analysis scattering and diffraction methods
Material Type:
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Computer simulation tools for x-ray analysis scattering and diffraction methods

Sergio Luiz Morelhão

New York Springer 2016

Emprestado de IF - Instituto de Física    (548 M839c )(Acessar)

4
Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only
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Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only

P Scardi (Paolo); Robert E Dinnebier

Switzerland : Trans Tech 2010

Localização: IF - Instituto de Física    (MS MASCF v.651 )(Acessar)

5
Simultaneous combination of spectroscopies with X-ray absorption, scattering and diffraction
Simultaneous combination of spectroscopies with X-ray absorption, scattering and diffraction
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Simultaneous combination of spectroscopies with X-ray absorption, scattering and diffraction

Workshop on Simultaneous Combination of Spectroscopies with X-ray Absortption, Scattering and Diffraction (2011 St Aubin, France)

Phase Transitions v.84, n.8, 2011

London Taylor & Francis 2011

Localização: IF - Instituto de Física    (Phase Transit. Vol. 84, number 8, 2011 )(Acessar)

6
Fluorescence quantum yield determination of molecules in liquids by thermally driven conical diffraction
Fluorescence quantum yield determination of molecules in liquids by thermally driven conical diffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Fluorescence quantum yield determination of molecules in liquids by thermally driven conical diffraction

Sthanley R. De Lima Gustavo J Pereira; Djalmir N Messias; Acácio A Andrade; Elisabete Oliveira; Carlos Lodeiro; Sérgio Carlos Zílio; Viviane Pilla

Journal of Luminescence Amsterdam : Elsevier BV v. 197 p. 175-179, May 2018

Amsterdam 2018

Localização: IFSC - Inst. Física de São Carlos    (PROD027310 )(Acessar)

7
The basics of crystallography and diffraction
The basics of crystallography and diffraction
Material Type:
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The basics of crystallography and diffraction

C. Hammond (Christopher) 1942-

Oxford Oxford University Press New York 2010

Item não circula. Consulte sua biblioteca.(Acessar)

8
An in-situ synchrotron X-ray powder diffraction study of size dependent phase transitions in nanostructured ZrO2-Sc2O3 solid solutions
An in-situ synchrotron X-ray powder diffraction study of size dependent phase transitions in nanostructured ZrO2-Sc2O3 solid solutions
Material Type:
Artigo de Congresso 		Adicionar ao Meu Espaço

An in-situ synchrotron X-ray powder diffraction study of size dependent phase transitions in nanostructured ZrO2-Sc2O3 solid solutions

Paula M. Abdala D. G Lamas; A. F Craievich; Márcia Fantini; Congress and General Assembly of the International Union of Crystallography 2011 Madrid, Espanha XXII

Acta Crystallographica Section A-Foundation and Advances Chester: IUCr publishing, 2011 v. 67, p. C493-C494, Suplmento: S, resumo: MS39.P15, online

Chester 2011

Item não circula. Consulte sua biblioteca.(Acessar)

9
Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction
Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction
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Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction

Raul de Oliveira Freitas Beatriz Diaz; Eduardo Abramof; A. A Quivy (Alain André); Sérgio Luiz Morelhão; Biennial Conference on High Resolution X-Ray Diffraction and Imaging 2009 Linz, Austria 9th

Physica Status Solidi A - Applications and Materials Science v. 206, n. 8, p, 1714-1717, 2009

Weinheim Wiley-VCH Verlag 2009

Acesso online

10
Simultaneous raman-x-ray diffraction absorption studies for the in situ investigation of solid state tranformations and reactions at non-ambient conditions
Simultaneous raman-x-ray diffraction absorption studies for the in situ investigation of solid state tranformations and reactions at non-ambient conditions
Material Type:
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Simultaneous raman-x-ray diffraction absorption studies for the in situ investigation of solid state tranformations and reactions at non-ambient conditions

Workshop on Simultaneous Raman-X-Ray Diffraction Absorption Studies for the in Situ Investigation of Solid State Tranformations and Reactions at non-ambient Conditions (2008 Grenoble, France)

Phase Transitions v.82, n.4, 2009

London Taylor & Francis 2009

Localização: IF - Instituto de Física    (Phase Transit. v.82 n.4 2009 )(Acessar)

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Deste Autor:

  1. Ellena, J
  2. Padilha, A
  3. Sandim, H
  4. Oliveira, M
  5. Oliveira Neto, A

Neste Assunto:

  1. DIFRAÇÃO POR RAIOS X
  2. Nanopartículas
  3. Cristalografia
  4. Materiais
  5. Materiais Compósitos

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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