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1
High resolution x-ray diffraction analysis of InGaAs/InP superlattices
High resolution x-ray diffraction analysis of InGaAs/InP superlattices
Material Type:
Artigo 		Adicionar ao Meu Espaço

High resolution x-ray diffraction analysis of InGaAs/InP superlattices

D. M. Cornet R. R LaPierre; D Comedi; Yuri A Pusep

Journal of Applied Physics Melville v. 100, n. 4, p. 043518-1-043518-6, Aug. 2006

Melville 2006

Localização: IFSC - Inst. Física de São Carlos    (PROD012615 )(Acessar)

2
Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnets
Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnets
Material Type:
Artigo 		Adicionar ao Meu Espaço

Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnets

Marcos Flavio de Campos Taeko Yonamine; Marcos Fukuhara; Rogerio Machado; Sergio Romero; Fernando José Gomes Landgraf 1954-; Daniel Rodrigues; Frank Patrick Missell

Journal of Applied Physics v. 101, n. 9, p. 09K516/1-09K516/3

New York 2007

Acesso online

3
Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnets
Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnets
Material Type:
Artigo 		Adicionar ao Meu Espaço

Electron backscattered diffraction texture analysis of 'SmCo IND.5' magnets

Marcos Flavio de Campos Taeko Yonamine; Marcos Fukuhara; Rogerio Machado; Sergio Romero; Fernando José Gomes Landgraf 1954-; Daniel Rodrigues; Frank Patrick Missell

Journal of Applied Physics v. 101, n. 9, p. 09K516/1-09K516/3

New York 2007

Acesso online

4
High resolution x-ray diffraction analysis of InGaAs/InP superlattices
High resolution x-ray diffraction analysis of InGaAs/InP superlattices
Material Type:
Artigo 		Adicionar ao Meu Espaço

High resolution x-ray diffraction analysis of InGaAs/InP superlattices

D. M. Cornet R. R LaPierre; D Comedi; Yuri A Pusep

Journal of Applied Physics Melville v. 100, n. 4, p. 043518-1-043518-6, Aug. 2006

Melville 2006

Localização: IFSC - Inst. Física de São Carlos    (PROD012615 )(Acessar)

5
Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction
Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction

S Martini A. A Quivy (Alain André); M J da Silva; T E Lamas; E C F da Silva; J. R Leite (José Roberto); E Abramof

Journal of Applied Physics v. 94, n. 11, p. 7050-7052, 2003

New york 2003

Acesso online

6
Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction
Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction

Raul de Oliveira Freitas A. A Quivy (Alain André); Sérgio Luiz Morelhão

Journal of Applied Physics, v. 105, n. 3, p. 036104-1/-03104/3

Melville 2009

Acesso online

7
Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction
Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Ex-situ investigation of indium segregation in InGaAs/GaAs quantum wells using high-resolution x-ray diffraction

S Martini A. A Quivy (Alain André); M J da Silva; T E Lamas; E C F da Silva; J. R Leite (José Roberto); E Abramof

Journal of Applied Physics v. 94, n. 11, p. 7050-7052, 2003

New york 2003

Acesso online

8
Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction
Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction
Material Type:
Artigo 		Adicionar ao Meu Espaço

Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction

Raul de Oliveira Freitas A. A Quivy (Alain André); Sérgio Luiz Morelhão

Journal of Applied Physics, v. 105, n. 3, p. 036104-1/-03104/3

Melville 2009

Acesso online

9
Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry
Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry
Material Type:
Artigo 		Adicionar ao Meu Espaço

Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry

Hellen Cristine Santos Tiago Fiorini da Silva; Alisson Rodolfo Leite; Renan Ferreira de Assis; Pedro Herzilio Ottoni Viviani de Campos; Marcia de Almeida Rizzutto; Manfredo Harri Tabacniks

Journal of Applied Physics New York: AIP Publishing, 2019 v. 126, n. 4, 10.1063, 1.5108746

New York 2019

Item não circula. Consulte sua biblioteca.(Acessar)

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Deste Autor:

  1. Quivy, A
  2. Yonamine, T
  3. Romero, S
  4. Campos, M
  5. Fukuhara, M

Neste Assunto:

  1. Difração Por Raios X
  2. Semicondutores
  3. Estrutura Eletrônica
  4. Óptica Eletrônica
  5. Materiais Magnéticos

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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