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Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude
Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude
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Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude

Huber, Ferdinand ; Giessibl, Franz J.

Journal of applied physics, 2020-05, Vol.127 (18) [Periódico revisado por pares]

Melville: American Institute of Physics

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22
Thermal noise in contact atomic force microscopy
Thermal noise in contact atomic force microscopy
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Thermal noise in contact atomic force microscopy

Ma, Chengfu ; Zhou, Chenggang ; Peng, Jinlan ; Chen, Yuhang ; Arnold, Walter ; Chu, Jiaru

Journal of applied physics, 2021-06, Vol.129 (23) [Periódico revisado por pares]

Melville: American Institute of Physics

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23
The impact of cathode surface roughness and multiple breakdown events on microscale gas breakdown at atmospheric pressure
The impact of cathode surface roughness and multiple breakdown events on microscale gas breakdown at atmospheric pressure
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The impact of cathode surface roughness and multiple breakdown events on microscale gas breakdown at atmospheric pressure

Brayfield, Russell S. ; Fairbanks, Andrew J. ; Loveless, Amanda M. ; Gao, Shengjie ; Dhanabal, Agni ; Li, Weihang ; Darr, Caleb ; Wu, Wenzhuo ; Garner, Allen L.

Journal of applied physics, 2019-05, Vol.125 (20) [Periódico revisado por pares]

Melville: American Institute of Physics

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24
Challenges of relaxed n-type GaP on Si and strategies to enable low threading dislocation density
Challenges of relaxed n-type GaP on Si and strategies to enable low threading dislocation density
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Challenges of relaxed n-type GaP on Si and strategies to enable low threading dislocation density

Hool, Ryan D. ; Sun, Yukun ; Li, Brian D. ; Dhingra, Pankul ; Tham, Rachel W. ; Fan, Shizhao ; Lee, Minjoo Larry

Journal of applied physics, 2021-12, Vol.130 (24) [Periódico revisado por pares]

United States: American Institute of Physics (AIP)

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25
Shortcomings of the Derjaguin–Muller–Toporov model in dynamic atomic force microscopy
Shortcomings of the Derjaguin–Muller–Toporov model in dynamic atomic force microscopy
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Shortcomings of the Derjaguin–Muller–Toporov model in dynamic atomic force microscopy

Theiler, Pius M. ; Ritz, Christian ; Stemmer, Andreas

Journal of applied physics, 2021-12, Vol.130 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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26
Evolution of planar defects during homoepitaxial growth of β-Ga2O3 layers on (100) substrates—A quantitative model
Evolution of planar defects during homoepitaxial growth of β-Ga2O3 layers on (100) substrates—A quantitative model
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Evolution of planar defects during homoepitaxial growth of β-Ga2O3 layers on (100) substrates—A quantitative model

Schewski, R. ; Baldini, M. ; Irmscher, K. ; Fiedler, A. ; Markurt, T. ; Neuschulz, B. ; Remmele, T. ; Schulz, T. ; Wagner, G. ; Galazka, Z. ; Albrecht, M.

Journal of applied physics, 2016-12, Vol.120 (22) [Periódico revisado por pares]

Melville: American Institute of Physics

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27
Controlled CVD growth of ultrathin Mo2C (MXene) flakes
Controlled CVD growth of ultrathin Mo2C (MXene) flakes
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Controlled CVD growth of ultrathin Mo2C (MXene) flakes

Öper, Merve ; Yorulmaz, Uǧur ; Sevik, Cem ; Ay, Feridun ; Kosku Perkgöz, Nihan

Journal of applied physics, 2022-01, Vol.131 (2) [Periódico revisado por pares]

Melville: American Institute of Physics

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28
Three-dimensional photoinduced force microscopy reveals artifacts from photothermal tip vibrations
Three-dimensional photoinduced force microscopy reveals artifacts from photothermal tip vibrations
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Three-dimensional photoinduced force microscopy reveals artifacts from photothermal tip vibrations

Ritz, Christian ; Lu, Bin ; Theiler, Pius M. ; Stemmer, Andreas

Journal of applied physics, 2023-10, Vol.134 (14) [Periódico revisado por pares]

Melville: American Institute of Physics

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29
Reaction of GeO2 with Ge and crystallization of GeO2 on Ge
Reaction of GeO2 with Ge and crystallization of GeO2 on Ge
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Reaction of GeO2 with Ge and crystallization of GeO2 on Ge

Xie, Min ; Nishimura, Tomonori ; Yajima, Takeaki ; Toriumi, Akira

Journal of applied physics, 2020-01, Vol.127 (2) [Periódico revisado por pares]

Melville: American Institute of Physics

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30
Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum
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Resistive switching study in HfO2 based resistive memories by conductive atomic force microscopy in vacuum

Singh, A. K. ; Blonkowski, S. ; Kogelschatz, M.

Journal of applied physics, 2018-07, Vol.124 (1) [Periódico revisado por pares]

Melville: American Institute of Physics

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