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Refinado por: Base de dados/Biblioteca: Engineered Materials Abstracts remover
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30-nm Contacted Gate Pitch Back-Gate Carbon Nanotube FETs for Sub-3-nm Nodes
30-nm Contacted Gate Pitch Back-Gate Carbon Nanotube FETs for Sub-3-nm Nodes
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30-nm Contacted Gate Pitch Back-Gate Carbon Nanotube FETs for Sub-3-nm Nodes

Srimani, Tathagata ; Hills, Gage ; Bishop, Mindy Deanna ; Shulaker, Max M.

IEEE transactions on nanotechnology, 2019, Vol.18, p.132-138 [Periódico revisado por pares]

New York: IEEE

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2
Understanding Energy Efficiency Benefits of Carbon Nanotube Field-Effect Transistors for Digital VLSI
Understanding Energy Efficiency Benefits of Carbon Nanotube Field-Effect Transistors for Digital VLSI
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Understanding Energy Efficiency Benefits of Carbon Nanotube Field-Effect Transistors for Digital VLSI

Hills, Gage ; Bardon, Marie Garcia ; Doornbos, Gerben ; Yakimets, Dmitry ; Schuddinck, Pieter ; Baert, Rogier ; Doyoung Jang ; Mattii, Luca ; Sherazi, Syed Muhammed Yasser ; Rodopoulos, Dimitrios ; Ritzenthaler, Romain ; Chi-Shuen Lee ; Thean, Aaron Voon-Yew ; Radu, Iuliana ; Spessot, Alessio ; Debacker, Peter ; Catthoor, Francky ; Raghavan, Praveen ; Shulaker, Max M. ; Wong, H.-S Philip ; Mitra, Subhasish

IEEE transactions on nanotechnology, 2018-11, Vol.17 (6), p.1259-1269 [Periódico revisado por pares]

New York: IEEE

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3
Biosensor Chip for Point-of-Care Diagnostics: Carbon Nanotube Sensing Platform for Bacterial Detection and Identification
Biosensor Chip for Point-of-Care Diagnostics: Carbon Nanotube Sensing Platform for Bacterial Detection and Identification
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Biosensor Chip for Point-of-Care Diagnostics: Carbon Nanotube Sensing Platform for Bacterial Detection and Identification

Ho, Rebecca ; Fuller, Samuel ; Lee, Hae-Seung ; Shulaker, Max M.

IEEE transactions on nanotechnology, 2024, Vol.23, p.281-285 [Periódico revisado por pares]

New York: IEEE

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