Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Spring constant calibration of atomic force microscope cantilevers of arbitrary shapeSader, John E ; Sanelli, Julian A ; Adamson, Brian D ; Monty, Jason P ; Wei, Xingzhan ; Crawford, Simon A ; Friend, James R ; Marusic, Ivan ; Mulvaney, Paul ; Bieske, Evan JReview of scientific instruments, 2012-10, Vol.83 (10), p.103705-103705 [Periódico revisado por pares]United StatesTexto completo disponível |
2 |
Material Type: Artigo
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Large atom number Bose-Einstein condensate machinesStreed, Erik W. ; Chikkatur, Ananth P. ; Gustavson, Todd L. ; Boyd, Micah ; Torii, Yoshio ; Schneble, Dominik ; Campbell, Gretchen K. ; Pritchard, David E. ; Ketterle, WolfgangReview of scientific instruments, 2006-02, Vol.77 (2), p.023106-023106-13 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
3 |
Material Type: Artigo
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SuperADAM: Upgraded polarized neutron reflectometer at the Institut Laue-LangevinDevishvili, A. ; Zhernenkov, K. ; Dennison, A. J. C. ; Toperverg, B. P. ; Wolff, M. ; Hjörvarsson, B. ; Zabel, H.Review of scientific instruments, 2013-02, Vol.84 (2), p.025112-025112 [Periódico revisado por pares]United StatesTexto completo disponível |
4 |
Material Type: Artigo
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Spectral encoding method for measuring the relative arrival time between x-ray/optical pulsesBionta, M. R. ; Hartmann, N. ; Weaver, M. ; French, D. ; Nicholson, D. J. ; Cryan, J. P. ; Glownia, J. M. ; Baker, K. ; Bostedt, C. ; Chollet, M. ; Ding, Y. ; Fritz, D. M. ; Fry, A. R. ; Kane, D. J. ; Krzywinski, J. ; Lemke, H. T. ; Messerschmidt, M. ; Schorb, S. ; Zhu, D. ; White, W. E. ; Coffee, R. N.Review of scientific instruments, 2014-08, Vol.85 (8), p.083116-083116 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
5 |
Material Type: Artigo
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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studiesSzlachetko, J ; Nachtegaal, M ; de Boni, E ; Willimann, M ; Safonova, O ; Sa, J ; Smolentsev, G ; Szlachetko, M ; van Bokhoven, J A ; Dousse, J-Cl ; Hoszowska, J ; Kayser, Y ; Jagodzinski, P ; Bergamaschi, A ; Schmitt, B ; David, C ; Lücke, AReview of scientific instruments, 2012-10, Vol.83 (10), p.103105-103105 [Periódico revisado por pares]United StatesTexto completo disponível |
6 |
Material Type: Artigo
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Integrated fiber-mirror ion trap for strong ion-cavity couplingBrandstätter, B ; McClung, A ; Schüppert, K ; Casabone, B ; Friebe, K ; Stute, A ; Schmidt, P O ; Deutsch, C ; Reichel, J ; Blatt, R ; Northup, T EReview of scientific instruments, 2013-12, Vol.84 (12), p.123104-123104 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
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CRDS with a VECSEL for broad-band high sensitivity spectroscopy in the 2.3 μm windowČermák, P. ; Chomet, B. ; Ferrieres, L. ; Vasilchenko, S. ; Mondelain, D. ; Kassi, S. ; Campargue, A. ; Denet, S. ; Lecocq, V. ; Myara, M. ; Cerutti, L. ; Garnache, A.Review of scientific instruments, 2016-08, Vol.87 (8), p.083109-083109 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
8 |
Material Type: Artigo
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Calibration of time of flight detectors using laser-driven neutron sourceMirfayzi, S R ; Kar, S ; Ahmed, H ; Krygier, A G ; Green, A ; Alejo, A ; Clarke, R ; Freeman, R R ; Fuchs, J ; Jung, D ; Kleinschmidt, A ; Morrison, J T ; Najmudin, Z ; Nakamura, H ; Norreys, P ; Oliver, M ; Roth, M ; Vassura, L ; Zepf, M ; Borghesi, MReview of scientific instruments, 2015-07, Vol.86 (7), p.073308-073308 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
9 |
Material Type: Artigo
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VUV‐SX spherical grating monochromator for BEPC beamline 4B9BShu, D. ; Wang, W. ; Liu, W. ; Zhang, Y. ; Wang, M. ; Liu, J. ; He, W. ; Cong, Z. ; Xie, Q.Review of Scientific Instruments, 1989-07, Vol.60 (7), p.2085-2088 [Periódico revisado por pares]Texto completo disponível |
10 |
Material Type: Artigo
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Experimental evaluation of the response of micro-channel plate detector to ions with 10s of MeV energiesJeong, Tae Won ; Singh, P. K. ; Scullion, C. ; Ahmed, H. ; Kakolee, K. F. ; Hadjisolomou, P. ; Alejo, A. ; Kar, S. ; Borghesi, M. ; Ter-Avetisyan, S.Review of scientific instruments, 2016-08, Vol.87 (8), p.083301-083301 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |