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Refinado por: Base de dados/Biblioteca: AIP_美国物理联合会现刊(与NSTL共建) remover assunto: Physics remover
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1
System dynamics monitoring using PIC micro-controller-based PLSE
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System dynamics monitoring using PIC micro-controller-based PLSE

Djeufa Dagoumguei, Guy Morgand ; Tagne, Samuel ; Eyebe Fouda, J. S. Armand ; Koepf, Wolfram

Chaos (Woodbury, N.Y.), 2023-07, Vol.33 (7) [Periódico revisado por pares]

United States: American Institute of Physics

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2
Monitored Beam X Ray Absorption Spectrometer
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Monitored Beam X Ray Absorption Spectrometer

Panson, Armand J. ; Kuriyama, Masao

Review of scientific instruments, 1965-10, Vol.36 (10), p.1488-1489 [Periódico revisado por pares]

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3
dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology
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dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology

Armand, J. ; Martinez, Frédéric ; Benoit, P. ; Valenza, M. ; Vincent, E. ; Huard, V. ; Rochereau, K.

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2009-05, Vol.27 (3)

American Vacuum Society (AVS)

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4
Optically pumped GeSn micro-disks with 16% Sn lasing at 3.1 μm up to 180 K
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Optically pumped GeSn micro-disks with 16% Sn lasing at 3.1 μm up to 180 K

Reboud, V. ; Gassenq, A. ; Pauc, N. ; Aubin, J. ; Milord, L. ; Thai, Q. M. ; Bertrand, M. ; Guilloy, K. ; Rouchon, D. ; Rothman, J. ; Zabel, T. ; Armand Pilon, F. ; Sigg, H. ; Chelnokov, A. ; Hartmann, J. M. ; Calvo, V.

Applied physics letters, 2017-08, Vol.111 (9) [Periódico revisado por pares]

Melville: American Institute of Physics

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5
Mid-infrared supercontinuum generation in a low-loss germanium-on-silicon waveguide
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Mid-infrared supercontinuum generation in a low-loss germanium-on-silicon waveguide

Della Torre, Alberto ; Sinobad, Milan ; Armand, Remi ; Luther-Davies, Barry ; Ma, Pan ; Madden, Stephen ; Mitchell, Arnan ; Moss, David J. ; Hartmann, Jean-Michel ; Reboud, Vincent ; Fedeli, Jean-Marc ; Monat, Christelle ; Grillet, Christian

APL photonics, 2021-01, Vol.6 (1), p.016102-016102-7 [Periódico revisado por pares]

AIP Publishing LLC

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6
In situ Raman imaging of interdiffusion in a microchannel
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In situ Raman imaging of interdiffusion in a microchannel

Salmon, Jean-Baptiste ; Ajdari, Armand ; Tabeling, Patrick ; Servant, Laurent ; Talaga, David ; Joanicot, Mathieu

Applied physics letters, 2005-02, Vol.86 (9), p.094106-094106-3 [Periódico revisado por pares]

American Institute of Physics

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7
Evidence of Germanium precipitation in phase-change Ge1−xTex thin films by Raman scattering
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Evidence of Germanium precipitation in phase-change Ge1−xTex thin films by Raman scattering

Gourvest, E. ; Lhostis, S. ; Kreisel, J. ; Armand, M. ; Maitrejean, S. ; Roule, A. ; Vallée, C.

Applied physics letters, 2009-07, Vol.95 (3), p.31908 [Periódico revisado por pares]

American Institute of Physics

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8
Pulse-to-pulse jitter measurement by photon correlation in high- β lasers
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Pulse-to-pulse jitter measurement by photon correlation in high- β lasers

Lebreton, Armand ; Abram, Izo ; Braive, Rémy ; Belabas, Nadia ; Sagnes, Isabelle ; Marsili, Francesco ; Verma, Varun B. ; Nam, Sae Woo ; Gerrits, Thomas ; Robert-Philip, Isabelle ; Stevens, Martin J. ; Beveratos, Alexios

Applied physics letters, 2015-01, Vol.106 (3) [Periódico revisado por pares]

Melville: American Institute of Physics

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9
Experimental study and modeling of polydimethylsiloxane peristaltic micropumps
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Experimental study and modeling of polydimethylsiloxane peristaltic micropumps

Goulpeau, Jacques ; Trouchet, Daniel ; Ajdari, Armand ; Tabeling, Patrick

Journal of applied physics, 2005-08, Vol.98 (4) [Periódico revisado por pares]

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10
Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions
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Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions

Groby, J.-P ; Wirgin, A ; De Ryck, L ; Lauriks, W ; Gilbert, R P ; Xu, Y S

The Journal of the Acoustical Society of America, 2009-08, Vol.126 (2), p.685-693 [Periódico revisado por pares]

Melville, NY: Acoustical Society of America

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