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New numerical low frequency noise model for front and buried oxide trap density characterization in FDSOI MOSFETs
New numerical low frequency noise model for front and buried oxide trap density characterization in FDSOI MOSFETs
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New numerical low frequency noise model for front and buried oxide trap density characterization in FDSOI MOSFETs

El Husseini, J. ; Martinez, F. ; Armand, J. ; Bawedin, M. ; Valenza, M. ; Ritzenthaler, R. ; Lime, F. ; Iñiguez, B. ; Faynot, O. ; Le Royer, C.

Microelectronic engineering, 2011-07, Vol.88 (7), p.1286-1290 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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Slow oxide trap density profile extraction using gate current low-frequency noise in ultrathin oxide MOSFETs
Slow oxide trap density profile extraction using gate current low-frequency noise in ultrathin oxide MOSFETs
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Slow oxide trap density profile extraction using gate current low-frequency noise in ultrathin oxide MOSFETs

Armand, J. ; Martinez, F. ; Valenza, M. ; Rochereau, K. ; Vincent, E.

Microelectronic engineering, 2007-09, Vol.84 (9), p.2382-2385 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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3
dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology
dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology
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dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology

Armand, J. ; Martinez, Frédéric ; Benoit, P. ; Valenza, M. ; Vincent, E. ; Huard, V. ; Rochereau, K.

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2009-05, Vol.27 (3)

American Vacuum Society (AVS)

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4
Extraction of slow oxide trap profiles by low-frequency noise analysis: Application to hot-electron-induced degradation
Extraction of slow oxide trap profiles by low-frequency noise analysis: Application to hot-electron-induced degradation
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Extraction of slow oxide trap profiles by low-frequency noise analysis: Application to hot-electron-induced degradation

Armand, J. ; Martinez, F. ; Gyani, J. ; Benoit, P. ; Valenza, M. ; Vincent, E. ; Huard, V. ; Guerin, C. ; Rochereau, K.

2008 9th International Conference on Ultimate Integration of Silicon, 2008, p.155-158

IEEE

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5
Lasing in strained germanium microbridges
Lasing in strained germanium microbridges
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Lasing in strained germanium microbridges

Armand Pilon, F T ; Lyasota, A ; Niquet, Y-M ; Reboud, V ; Calvo, V ; Pauc, N ; Widiez, J ; Bonzon, C ; Hartmann, J M ; Chelnokov, A ; Faist, J ; Sigg, H

Nature communications, 2019-06, Vol.10 (1), p.2724-8, Article 2724 [Periódico revisado por pares]

England: Nature Publishing Group

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6
Optically pumped GeSn micro-disks with 16% Sn lasing at 3.1 μm up to 180 K
Optically pumped GeSn micro-disks with 16% Sn lasing at 3.1 μm up to 180 K
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Optically pumped GeSn micro-disks with 16% Sn lasing at 3.1 μm up to 180 K

Reboud, V. ; Gassenq, A. ; Pauc, N. ; Aubin, J. ; Milord, L. ; Thai, Q. M. ; Bertrand, M. ; Guilloy, K. ; Rouchon, D. ; Rothman, J. ; Zabel, T. ; Armand Pilon, F. ; Sigg, H. ; Chelnokov, A. ; Hartmann, J. M. ; Calvo, V.

Applied physics letters, 2017-08, Vol.111 (9) [Periódico revisado por pares]

Melville: American Institute of Physics

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7
Investigation of lasing in highly strained germanium at the crossover to direct band gap
Investigation of lasing in highly strained germanium at the crossover to direct band gap
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Investigation of lasing in highly strained germanium at the crossover to direct band gap

Armand Pilon, F. T. ; Niquet, Y-M. ; Chretien, J. ; Pauc, N. ; Reboud, V. ; Calvo, V. ; Widiez, J. ; Hartmann, J. M. ; Chelnokov, A. ; Faist, J. ; Sigg, H.

Physical review research, 2022-07, Vol.4 (3), p.033050, Article 033050 [Periódico revisado por pares]

American Physical Society

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8
Mid-infrared supercontinuum generation in a low-loss germanium-on-silicon waveguide
Mid-infrared supercontinuum generation in a low-loss germanium-on-silicon waveguide
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Mid-infrared supercontinuum generation in a low-loss germanium-on-silicon waveguide

Della Torre, Alberto ; Sinobad, Milan ; Armand, Remi ; Luther-Davies, Barry ; Ma, Pan ; Madden, Stephen ; Mitchell, Arnan ; Moss, David J. ; Hartmann, Jean-Michel ; Reboud, Vincent ; Fedeli, Jean-Marc ; Monat, Christelle ; Grillet, Christian

APL photonics, 2021-01, Vol.6 (1), p.016102-016102-7 [Periódico revisado por pares]

AIP Publishing LLC

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9
Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions
Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions
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Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions

Groby, J.-P. ; Wirgin, A. ; De Ryck, L. ; Lauriks, W. ; Gilbert, R. P. ; Xu, Y. S.

The Journal of the Acoustical Society of America, 2009-08, Vol.126 (2), p.685-693 [Periódico revisado por pares]

Melville, NY: Acoustical Society of America

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10
TEM study of structural hardening in a new martensitic steel for aeronautic application
TEM study of structural hardening in a new martensitic steel for aeronautic application
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TEM study of structural hardening in a new martensitic steel for aeronautic application

Pettinari-Sturmel, F. ; Kedjar, B. ; Douin, J. ; Gatel, C. ; Delagnes, D. ; Coujou, A.

Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2013-08, Vol.576, p.290-297 [Periódico revisado por pares]

Kidlington: Elsevier B.V

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