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Material Type: Artigo
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System dynamics monitoring using PIC micro-controller-based PLSEDjeufa Dagoumguei, Guy Morgand ; Tagne, Samuel ; Eyebe Fouda, J. S. Armand ; Koepf, WolframChaos (Woodbury, N.Y.), 2023-07, Vol.33 (7) [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Optically pumped GeSn micro-disks with 16% Sn lasing at 3.1 μm up to 180 KReboud, V. ; Gassenq, A. ; Pauc, N. ; Aubin, J. ; Milord, L. ; Thai, Q. M. ; Bertrand, M. ; Guilloy, K. ; Rouchon, D. ; Rothman, J. ; Zabel, T. ; Armand Pilon, F. ; Sigg, H. ; Chelnokov, A. ; Hartmann, J. M. ; Calvo, V.Applied physics letters, 2017-08, Vol.111 (9) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Pulse-to-pulse jitter measurement by photon correlation in high- β lasersLebreton, Armand ; Abram, Izo ; Braive, Rémy ; Belabas, Nadia ; Sagnes, Isabelle ; Marsili, Francesco ; Verma, Varun B. ; Nam, Sae Woo ; Gerrits, Thomas ; Robert-Philip, Isabelle ; Stevens, Martin J. ; Beveratos, AlexiosApplied physics letters, 2015-01, Vol.106 (3) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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Material Type: Artigo
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Inverted cavity GaAs/InGaAs asymmetric Fabry-Perot reflection modulatorKEZHONG HU ; LI CHEN ; ANUPAM MADHUKAR ; PING CHEN ; KYRIAKAKIS, C ; KARIM, Z ; TANGUAY, A. RApplied physics letters, 1991-09, Vol.59 (14), p.1664-1666 [Periódico revisado por pares]Melville, NY: American Institute of PhysicsTexto completo disponível |