Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
![]() |
System dynamics monitoring using PIC micro-controller-based PLSEDjeufa Dagoumguei, Guy Morgand ; Tagne, Samuel ; Eyebe Fouda, J. S. Armand ; Koepf, WolframChaos (Woodbury, N.Y.), 2023-07, Vol.33 (7) [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
2 |
Material Type: Artigo
|
![]() |
Monitored Beam X Ray Absorption SpectrometerPanson, Armand J. ; Kuriyama, MasaoReview of scientific instruments, 1965-10, Vol.36 (10), p.1488-1489 [Periódico revisado por pares]Texto completo disponível |
3 |
Material Type: Artigo
|
![]() |
dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technologyArmand, J. ; Martinez, Frédéric ; Benoit, P. ; Valenza, M. ; Vincent, E. ; Huard, V. ; Rochereau, K.Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2009-05, Vol.27 (3)American Vacuum Society (AVS)Texto completo disponível |
4 |
Material Type: Artigo
|
![]() |
Mid-infrared supercontinuum generation in a low-loss germanium-on-silicon waveguideDella Torre, Alberto ; Sinobad, Milan ; Armand, Remi ; Luther-Davies, Barry ; Ma, Pan ; Madden, Stephen ; Mitchell, Arnan ; Moss, David J. ; Hartmann, Jean-Michel ; Reboud, Vincent ; Fedeli, Jean-Marc ; Monat, Christelle ; Grillet, ChristianAPL photonics, 2021-01, Vol.6 (1), p.016102-016102-7 [Periódico revisado por pares]AIP Publishing LLCTexto completo disponível |
5 |
Material Type: Artigo
|
![]() |
In situ Raman imaging of interdiffusion in a microchannelSalmon, Jean-Baptiste ; Ajdari, Armand ; Tabeling, Patrick ; Servant, Laurent ; Talaga, David ; Joanicot, MathieuApplied physics letters, 2005-02, Vol.86 (9), p.094106-094106-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
6 |
Material Type: Artigo
|
![]() |
Evidence of Germanium precipitation in phase-change Ge1−xTex thin films by Raman scatteringGourvest, E. ; Lhostis, S. ; Kreisel, J. ; Armand, M. ; Maitrejean, S. ; Roule, A. ; Vallée, C.Applied physics letters, 2009-07, Vol.95 (3), p.31908 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
|
![]() |
Pulse-to-pulse jitter measurement by photon correlation in high- β lasersLebreton, Armand ; Abram, Izo ; Braive, Rémy ; Belabas, Nadia ; Sagnes, Isabelle ; Marsili, Francesco ; Verma, Varun B. ; Nam, Sae Woo ; Gerrits, Thomas ; Robert-Philip, Isabelle ; Stevens, Martin J. ; Beveratos, AlexiosApplied physics letters, 2015-01, Vol.106 (3) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
8 |
Material Type: Artigo
|
![]() |
Experimental study and modeling of polydimethylsiloxane peristaltic micropumpsGoulpeau, Jacques ; Trouchet, Daniel ; Ajdari, Armand ; Tabeling, PatrickJournal of applied physics, 2005-08, Vol.98 (4) [Periódico revisado por pares]Texto completo disponível |
9 |
Material Type: Artigo
|
![]() |
Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusionsGroby, J.-P. ; Wirgin, A. ; De Ryck, L. ; Lauriks, W. ; Gilbert, R. P. ; Xu, Y. S.The Journal of the Acoustical Society of America, 2009-08, Vol.126 (2), p.685-693 [Periódico revisado por pares]Melville, NY: Acoustical Society of AmericaTexto completo disponível |
10 |
Material Type: Artigo
|
![]() |
Conjugated polymer∕molten salt blends: The relationship between morphology and electrical agingHabrard, F. ; Ouisse, T. ; Stephan, O. ; Armand, M. ; Stark, M. ; Huant, S. ; Dubard, E. ; Chevrier, J.Journal of applied physics, 2004-12, Vol.96 (12), p.7219-7224 [Periódico revisado por pares]Texto completo disponível |