skip to main content
Idioma:
Mostrar Somente
Refinado por: Base de dados/Biblioteca: AIP_美国物理联合会现刊（与NSTL共建） remover assunto: Technology remover Physics remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Monitored Beam X Ray Absorption Spectrometer
Monitored Beam X Ray Absorption Spectrometer
Material Type:
Artigo 		Adicionar ao Meu Espaço

Monitored Beam X Ray Absorption Spectrometer

Panson, Armand J. ; Kuriyama, Masao

Review of scientific instruments, 1965-10, Vol.36 (10), p.1488-1489 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
2
dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology
dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology
Material Type:
Artigo 		Adicionar ao Meu Espaço

dc and low frequency noise analysis of Fowler–Nordheim stress of n-channel metal-oxide semiconductor field-effect transistors processed in a 65 nm technology

Armand, J. ; Martinez, Frédéric ; Benoit, P. ; Valenza, M. ; Vincent, E. ; Huard, V. ; Rochereau, K.

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2009-05, Vol.27 (3)

American Vacuum Society (AVS)

Texto completo disponível

Citações Citado por
3
Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions
Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions
Material Type:
Artigo 		Adicionar ao Meu Espaço

Acoustic response of a rigid-frame porous medium plate with a periodic set of inclusions

Groby, J.-P. ; Wirgin, A. ; De Ryck, L. ; Lauriks, W. ; Gilbert, R. P. ; Xu, Y. S.

The Journal of the Acoustical Society of America, 2009-08, Vol.126 (2), p.685-693 [Periódico revisado por pares]

Melville, NY: Acoustical Society of America

Texto completo disponível

Citações Citado por
4
Reconstruction of material properties profiles in one-dimensional macroscopically inhomogeneous rigid frame porous media in the frequency domain
Reconstruction of material properties profiles in one-dimensional macroscopically inhomogeneous rigid frame porous media in the frequency domain
Material Type:
Artigo 		Adicionar ao Meu Espaço

Reconstruction of material properties profiles in one-dimensional macroscopically inhomogeneous rigid frame porous media in the frequency domain

DE RYCK, L ; LAURIKS, W ; LECLAIRE, P ; GROBY, J. P ; WIRGIN, A ; DEPOLLIER, C

The Journal of the Acoustical Society of America, 2008-09, Vol.124 (3), p.1591-1606 [Periódico revisado por pares]

Woodbury, NY: Acoustical Society of America

Texto completo disponível

Citações Citado por
5
Deposition of silicon dioxide films using the helicon diffusion reactor for integrated optics applications
Deposition of silicon dioxide films using the helicon diffusion reactor for integrated optics applications
Material Type:
Artigo 		Adicionar ao Meu Espaço

Deposition of silicon dioxide films using the helicon diffusion reactor for integrated optics applications

Giroult‐Matlakowski, G. ; Charles, C. ; Durandet, A. ; Boswell, R. W. ; Armand, S. ; Persing, H. M. ; Perry, A. J. ; Lloyd, P. D. ; Hyde, S. R. ; Bogsanyi, D.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1994-09, Vol.12 (5), p.2754-2761 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por
6
OPTIMAL-DESIGN OF AN ELECTRET MICROPHONE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR PREAMPLIFIER
OPTIMAL-DESIGN OF AN ELECTRET MICROPHONE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR PREAMPLIFIER
Material Type:
Artigo 		Adicionar ao Meu Espaço

OPTIMAL-DESIGN OF AN ELECTRET MICROPHONE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR PREAMPLIFIER

VANDERDONK, AGH ; BERGVELD, P ; VOORTHUYZEN, JA

The Journal of the Acoustical Society of America, 1992-04, Vol.91 (4), p.2261-2269 [Periódico revisado por pares]

WOODBURY: Amer Inst Physics

Texto completo disponível

Citações Citado por
7
Simple approximation to thermal attenuation in low‐energy atom–surface scattering
Simple approximation to thermal attenuation in low‐energy atom–surface scattering
Material Type:
Artigo 		Adicionar ao Meu Espaço

Simple approximation to thermal attenuation in low‐energy atom–surface scattering

Manson, J. R. ; Armand, G.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1987-07, Vol.5 (4), p.448-451 [Periódico revisado por pares]

Texto completo disponível

Citações Citado por

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Revistas revisadas por pares (6)

Data de Publicação 

De até
Refinar
  1. Antes de1965  (1)
  2. 1965Até1986  (1)
  3. 1987Até1991  (1)
  4. 1992Até1994  (2)
  5. Após 1994  (3)
  6. Mais opções open sub menu

  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

Buscando em bases de dados remotas. Favor aguardar.