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Material Type: Artigo
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Advances in Neural RenderingTewari, A. ; Thies, J. ; Mildenhall, B. ; Srinivasan, P. ; Tretschk, E. ; Yifan, W. ; Lassner, C. ; Sitzmann, V. ; Martin‐Brualla, R. ; Lombardi, S. ; Simon, T. ; Theobalt, C. ; Nießner, M. ; Barron, J. T. ; Wetzstein, G. ; Zollhöfer, M. ; Golyanik, V.Computer graphics forum, 2022-05, Vol.41 (2), p.703-735 [Periódico revisado por pares]Oxford: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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A Comprehensive Investigation of the Role of Imbalanced Learning for Software Defect PredictionSong, Qinbao ; Guo, Yuchen ; Shepperd, MartinIEEE transactions on software engineering, 2019-12, Vol.45 (12), p.1253-1269 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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State of the Art on Neural RenderingTewari, A. ; Fried, O. ; Thies, J. ; Sitzmann, V. ; Lombardi, S. ; Sunkavalli, K. ; Martin‐Brualla, R. ; Simon, T. ; Saragih, J. ; Nießner, M. ; Pandey, R. ; Fanello, S. ; Wetzstein, G. ; Zhu, J.‐Y. ; Theobalt, C. ; Agrawala, M. ; Shechtman, E. ; Goldman, D. B ; Zollhöfer, M.Computer graphics forum, 2020-05, Vol.39 (2), p.701-727 [Periódico revisado por pares]Oxford: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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A review of object detection based on deep learningXiao, Youzi ; Tian, Zhiqiang ; Yu, Jiachen ; Zhang, Yinshu ; Liu, Shuai ; Du, Shaoyi ; Lan, XuguangMultimedia tools and applications, 2020-09, Vol.79 (33-34), p.23729-23791 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |
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Material Type: Artigo
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OSQP: an operator splitting solver for quadratic programsStellato, Bartolomeo ; Banjac, Goran ; Goulart, Paul ; Bemporad, Alberto ; Boyd, StephenMathematical programming computation, 2020-12, Vol.12 (4), p.637-672 [Periódico revisado por pares]Berlin/Heidelberg: Springer Berlin HeidelbergTexto completo disponível |
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Material Type: Artigo
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Deep Semantic Feature Learning for Software Defect PredictionWang, Song ; Liu, Taiyue ; Nam, Jaechang ; Tan, LinIEEE transactions on software engineering, 2020-12, Vol.46 (12), p.1267-1293 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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A review on extreme learning machineWang, Jian ; Lu, Siyuan ; Wang, Shui-Hua ; Zhang, Yu-DongMultimedia tools and applications, 2022-12, Vol.81 (29), p.41611-41660 [Periódico revisado por pares]New York: Springer USTexto completo disponível |
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Material Type: Artigo
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Latent Space Physics: Towards Learning the Temporal Evolution of Fluid FlowWiewel, S. ; Becher, M. ; Thuerey, N.Computer graphics forum, 2019-05, Vol.38 (2), p.71-82 [Periódico revisado por pares]Oxford: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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DeepChain: Auditable and Privacy-Preserving Deep Learning with Blockchain-Based IncentiveWeng, Jiasi ; Weng, Jian ; Zhang, Jilian ; Li, Ming ; Zhang, Yue ; Luo, WeiqiIEEE transactions on dependable and secure computing, 2021-09, Vol.18 (5), p.2438-2455Washington: IEEETexto completo disponível |