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Material Type: Artigo
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A Survey on Software Fault LocalizationWong, W. Eric ; Ruizhi Gao ; Yihao Li ; Abreu, Rui ; Wotawa, FranzIEEE transactions on software engineering, 2016-08, Vol.42 (8), p.707-740 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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A large-scale empirical study of just-in-time quality assuranceKamei, Y. ; Shihab, E. ; Adams, B. ; Hassan, A. E. ; Mockus, A. ; Sinha, A. ; Ubayashi, N.IEEE transactions on software engineering, 2013-06, Vol.39 (6), p.757-773 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Data Quality: Some Comments on the NASA Software Defect DatasetsShepperd, M. ; Qinbao Song ; Zhongbin Sun ; Mair, C.IEEE transactions on software engineering, 2013-09, Vol.39 (9), p.1208-1215 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Software Development in Startup Companies: The Greenfield Startup ModelGiardino, Carmine ; Paternoster, Nicolo ; Unterkalmsteiner, Michael ; Gorschek, Tony ; Abrahamsson, PekkaIEEE transactions on software engineering, 2016-06, Vol.42 (6), p.585-604 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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The State of Practice in Model-Driven EngineeringWhittle, Jon ; Hutchinson, John ; Rouncefield, MarkIEEE software, 2014-05, Vol.31 (3), p.79-85 [Periódico revisado por pares]Los Alamitos, CA: IEEETexto completo disponível |
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Material Type: Artigo
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Evaluating Complexity, Code Churn, and Developer Activity Metrics as Indicators of Software VulnerabilitiesYonghee Shin ; Meneely, A. ; Williams, L. ; Osborne, J. A.IEEE transactions on software engineering, 2011-11, Vol.37 (6), p.772-787 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Researcher Bias: The Use of Machine Learning in Software Defect PredictionShepperd, Martin ; Bowes, David ; Hall, TracyIEEE transactions on software engineering, 2014-06, Vol.40 (6), p.603-616 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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An Attack Surface MetricManadhata, P K ; Wing, J MIEEE transactions on software engineering, 2011-05, Vol.37 (3), p.371-386 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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Material Type: Artigo
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Software Architecture Optimization Methods: A Systematic Literature ReviewAleti, A. ; Buhnova, B. ; Grunske, L. ; Koziolek, A. ; Meedeniya, I.IEEE transactions on software engineering, 2013-05, Vol.39 (5), p.658-683 [Periódico revisado por pares]New York: IEEETexto completo disponível |
10 |
Material Type: Artigo
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Reference Architectures for the Internet of ThingsWeyrich, Michael ; Ebert, ChristofIEEE software, 2016-01, Vol.33 (1), p.112-116 [Periódico revisado por pares]Los Alamitos: IEEETexto completo disponível |