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Material Type: Artigo
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Viewing computer science through citation analysis: Salton and Bergmark ReduxDevarakonda, Sitaram ; Korobskiy, Dmitriy ; Warnow, Tandy ; Chacko, GeorgeScientometrics, 2020-10, Vol.125 (1), p.271-287 [Periódico revisado por pares]Cham: Springer International PublishingTexto completo disponível |
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Material Type: Artigo
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AI Fairness 360: An extensible toolkit for detecting and mitigating algorithmic biasBellamy, R. K. E. ; Dey, K. ; Hind, M. ; Hoffman, S. C. ; Houde, S. ; Kannan, K. ; Lohia, P. ; Martino, J. ; Mehta, S. ; Mojsilovic, A. ; Nagar, S. ; Ramamurthy, K. Natesan ; Richards, J. ; Saha, D. ; Sattigeri, P. ; Singh, M. ; Varshney, K. R. ; Zhang, Y.IBM journal of research and development, 2019-07, Vol.63 (4/5), p.4-4:15 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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Does double‐blind peer review reduce bias? Evidence from a top computer science conferenceSun, Mengyi ; Barry Danfa, Jainabou ; Teplitskiy, MishaJournal of the American Society for Information Science and Technology, 2022-06, Vol.73 (6), p.811-819 [Periódico revisado por pares]Hoboken, USA: John Wiley & Sons, IncTexto completo disponível |
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Material Type: Artigo
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Using Scopus’s CiteScore for assessing the quality of computer science conferencesMeho, Lokman I.Journal of informetrics, 2019-02, Vol.13 (1), p.419-433 [Periódico revisado por pares]Elsevier LtdTexto completo disponível |
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Material Type: Livro
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Data Clustering: Algorithms and ApplicationsAggarwal, Charu C ; Reddy, Chandan K Reddy, Chandan K. ; Aggarwal, Charu C.Milton: CRC Press 2014Texto completo disponível |
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Material Type: Artigo
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Author‐based analysis of conference versus journal publication in computer scienceKim, JinseokJournal of the American Society for Information Science and Technology, 2019-01, Vol.70 (1), p.71-82 [Periódico revisado por pares]Hoboken: Wiley Periodicals IncTexto completo disponível |
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Material Type: Artigo
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A survey of safety and trustworthiness of deep neural networks: Verification, testing, adversarial attack and defence, and interpretabilityHuang, Xiaowei ; Kroening, Daniel ; Ruan, Wenjie ; Sharp, James ; Sun, Youcheng ; Thamo, Emese ; Wu, Min ; Yi, XinpingComputer science review, 2020-08, Vol.37, p.100270, Article 100270Elsevier IncTexto completo disponível |
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Material Type: Artigo
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Object Detection With Deep Learning: A ReviewZhao, Zhong-Qiu ; Zheng, Peng ; Xu, Shou-Tao ; Wu, XindongIEEE transaction on neural networks and learning systems, 2019-11, Vol.30 (11), p.3212-3232United States: IEEETexto completo disponível |
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Material Type: Artigo
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FactSheets: Increasing trust in AI services through supplier's declarations of conformityArnold, M. ; Bellamy, R. K. E. ; Hind, M. ; Houde, S. ; Mehta, S. ; Mojsilovic, A. ; Nair, R. ; Ramamurthy, K. Natesan ; Olteanu, A. ; Piorkowski, D. ; Reimer, D. ; Richards, J. ; Tsay, J. ; Varshney, K. R.IBM journal of research and development, 2019-07, Vol.63 (4/5), p.6-6:13 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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An ablation study on the use of publication venue quality to rank computer science departments: Publication quality is strongly correlated with the subjective perception of research strengthMaiti, Aniruddha ; Shi, Sai ; Vucetic, SlobodanScientometrics, 2023-08, Vol.128 (8), p.4197-4218 [Periódico revisado por pares]Cham: Springer International PublishingTexto completo disponível |