Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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The Reliability of Linear Feature ExtractorsYoung, T.Y.IEEE transactions on computers, 1971-01, Vol.C-20 (9), p.967-971 [Periódico revisado por pares]IEEETexto completo disponível |
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2 |
Material Type: Artigo
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An Efficient Algorithm for Generating Complete Test Sets for Combinational Logic CircuitsYau, S.S. ; Yu-Shan TangIEEE transactions on computers, 1971-01, Vol.C-20 (11), p.1245-1251 [Periódico revisado por pares]IEEETexto completo disponível |