Resultados de 1 a 10 de 2.370 para Busca Geral
Ordenado por:
Ordenado por:
RelevânciaOr hit Enter to replace sort method
- Relevância
- Data mais recente
- Data mais antiga
- Mais acessados
- Autor
- Título
Refinado por:
Nome da Publicação:
Journal Of Applied Physics
| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
![Erratum: “Influence of the thickness of a nanometric copper interlayer on Au/dielectric thermal boundary conductance” [J. Appl. Phys. 124, 105304 (2018)]](../images/pixel.png){kind=tracking}
Material Type: Artigo
|
|
Erratum: “Influence of the thickness of a nanometric copper interlayer on Au/dielectric thermal boundary conductance” [J. Appl. Phys. 124, 105304 (2018)]Blank, Maïté ; Weber, LudgerJournal of applied physics, 2019-04, Vol.125 (14) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 2 |
Material Type: Artigo
|
|
Investigating the origin of the far-field reflection interference fringe (RIF) of microdropletsKim, Iltai Isaac ; Lie, Yang ; Park, Jaesung ; Kim, Hyun-Joong ; Kim, Hong-Chul ; Yoon, HongkyuJournal of applied physics, 2024-05, Vol.135 (20) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 3 |
Material Type: Artigo
|
|
Effects of deposition conditions on the ferroelectric properties of (Al1−xScx)N thin filmsYasuoka, Shinnosuke ; Shimizu, Takao ; Tateyama, Akinori ; Uehara, Masato ; Yamada, Hiroshi ; Akiyama, Morito ; Hiranaga, Yoshiomi ; Cho, Yasuo ; Funakubo, HiroshiJournal of applied physics, 2020-09, Vol.128 (11) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 4 |
Material Type: Artigo
|
|
Revealing the phase transition scenario in antiferroelectric thin films by x-ray diffuse scatteringKniazeva, Maria A. ; Ganzha, Alexander E. ; Gao, Ran ; Dasgupta, Arvind ; Filimonov, Alexey V. ; Burkovsky, Roman G.Journal of applied physics, 2024-06, Vol.135 (24) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 5 |
Material Type: Artigo
|
|
Separation of terahertz and DC conductivity transitions in epitaxial vanadium dioxide filmsLu, Chang ; Gao, Min ; Liu, Junxiao ; Lu, Yantong ; Wen, Tianlong ; Lin, YuanJournal of applied physics, 2024-06, Vol.135 (22) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 6 |
Material Type: Artigo
|
|
Semi-analytical solution to the frequency-dependent Boltzmann transport equation for cross-plane heat conduction in thin filmsHua, Chengyun ; Minnich, Austin J.Journal of applied physics, 2015-05, Vol.117 (17) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 7 |
Material Type: Artigo
|
|
Frequency mismatch analysis of hemispherical shell resonators with both radius and thickness imperfectionsDeng, Kaixin ; Zeng, Libin ; Pan, Yao ; Jia, Yonglei ; Luo, Yiming ; Tao, Yunfeng ; Yuan, JieJournal of applied physics, 2024-05, Vol.135 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 8 |
Material Type: Artigo
|
|
Photothermal radiometry using normalized DC component for coating thickness evaluationChen, Fei ; Zhang, Kai ; Jiang, Haijun ; Shen, Zhonghua ; Chen, LiJournal of applied physics, 2023-11, Vol.134 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 9 |
Material Type: Artigo
|
|
Enhanced absorption of monolayer MoS2 with resonant back reflectorLiu, Jiang-Tao ; Wang, Tong-Biao ; Li, Xiao-Jing ; Liu, Nian-HuaJournal of applied physics, 2014-05, Vol.115 (19) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
| 10 |
Material Type: Artigo
|
|
Tuning time and energy resolution in time-resolved photoemission spectroscopy with nonlinear crystalsGauthier, Alexandre ; Sobota, Jonathan A. ; Gauthier, Nicolas ; Xu, Ke-Jun ; Pfau, Heike ; Rotundu, Costel R. ; Shen, Zhi-Xun ; Kirchmann, Patrick S.Journal of applied physics, 2020-09, Vol.128 (9) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
Resultados de 1 a 10 de 2.370 para Busca Geral
Ordenado por:
Ordenado por:
RelevânciaOr hit Enter to replace sort method
- Relevância
- Data mais recente
- Data mais antiga
- Mais acessados
- Autor
- Título
Personalize Seus Resultados
Refine Search Results
Expandir Meus Resultados
Refinar Meus Resultados
Assunto
- Physics (2.048)
- Science & Technology (2.011)
- Physics, Applied (2.010)
- Physical Sciences (2.010)
- Thickness (1.987)
- Applied Physics (1.100)
- Thin Films (758)
- General Physics And Astronomy (558)
- Materials Science (491)
- Substrates (473)
- Layers (432)
- Condensed Matter Physics, Superconductivity And Superfluidity (366)
- Classical And Quantum Mechanics, General Physics (361)
- Film Thickness (310)
- Dimensions (278)
- Deposition (223)
- Silicon (221)
- Magnetic Properties (211)
- X-Ray Diffraction (201)
- Anisotropy (196)
-
Mais opções
Data de Publicação
- Antes de1965 (70)
- 1965Até1979 (90)
- 1980Até1993 (227)
- 1994Até2008 (346)
- Após 2008 (1.644)
-
Mais opções
Base de Dados/Biblioteca
- AIP Journals (American Institute of Physics) (2.370)
- Science Citation Index Expanded (Web of Science) (1.862)
- Aerospace Database (1.458)
- Materials Research Database (75)
- METADEX (40)
- Aluminium Industry Abstracts (13)
- Engineered Materials Abstracts (7)
- Copper Technical Reference Library (3)
- Single Journals (3)
- Recercat (2)
- SpringerLink Journals (MCLS) (1)
- NASA Technical Reports Server (1)
- EBSCOhost Academic Search Premier (1)
- NORA - Norwegian Open Research Archives (1)
- Springer Nature - Springer Journals All 2022 (1)
-
Mais opções
Idioma
- Japonês (547)
- Norueguês (1)
-
Mais opções
Nome da Publicação
Página Inicial
RSS
Feed
Políticas
Fale Conosco-
Realização:
Logos de Redes Sociais: 