Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
---|---|---|---|
1 |
Material Type: Artigo
|
![]() |
Graphene Visualizes the First Water Adlayers on Mica at Ambient ConditionsXu, Ke ; Cao, Peigen ; Heath, James RScience (American Association for the Advancement of Science), 2010-09, Vol.329 (5996), p.1188-1191 [Periódico revisado por pares]Washington, DC: American Association for the Advancement of ScienceTexto completo disponível |
2 |
Material Type: Artigo
|
![]() |
X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systemsBiesinger, Mark C. ; Payne, Brad P. ; Lau, Leo W. M. ; Gerson, Andrea ; Smart, Roger St. C.Surface and interface analysis, 2009-04, Vol.41 (4), p.324-332 [Periódico revisado por pares]Chichester, UK: John Wiley & Sons, LtdTexto completo disponível |
3 |
Material Type: Artigo
|
![]() |
Thin film thickness measurements using Scanning White Light InterferometryManiscalco, B. ; Kaminski, P.M. ; Walls, J.M.Thin solid films, 2014-01, Vol.550, p.10-16 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
4 |
Material Type: Artigo
|
![]() |
Impact of layer thickness on the ferroelectric behaviour of silicon doped hafnium oxide thin filmsYurchuk, Ekaterina ; Müller, Johannes ; Knebel, Steve ; Sundqvist, Jonas ; Graham, Andrew P. ; Melde, Thomas ; Schröder, Uwe ; Mikolajick, ThomasThin solid films, 2013-04, Vol.533, p.88-92 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
5 |
Material Type: Artigo
|
![]() |
Role of film thickness on the properties of ZnO thin films grown by sol-gel methodKumar, Vinod ; Singh, Neetu ; Mehra, R.M. ; Kapoor, Avinashi ; Purohit, L.P. ; Swart, H.C.Thin solid films, 2013-07, Vol.539, p.161-165 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
6 |
Material Type: Artigo
|
![]() |
Effect of the seed layer thickness on the stability of ZnO nanorod arraysİkizler, Berrin ; Peker, Sümer M.Thin solid films, 2014-05, Vol.558, p.149-159 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
7 |
Material Type: Artigo
|
![]() |
Mechanical characterization of LiPON films using nanoindentationHerbert, E.G. ; Tenhaeff, W.E. ; Dudney, N.J. ; Pharr, G.M.Thin solid films, 2011-10, Vol.520 (1), p.413-418 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
8 |
Material Type: Artigo
|
![]() |
Study of polycrystalline Cu2ZnSnS4 films by Raman scatteringFERNANDES, P. A ; SALOME, P. M. P ; DA CUNHA, A. FJournal of alloys and compounds, 2011-07, Vol.509 (28), p.7600-7606 [Periódico revisado por pares]Kidlington: ElsevierTexto completo disponível |
9 |
Material Type: Artigo
|
![]() |
Magnetic properties and microstructure investigation of electrodeposited FeNi/ITO films with different thicknessCao, Derang ; Wang, Zhenkun ; Feng, Erxi ; Wei, Jinwu ; Wang, Jianbo ; Liu, QingfangJournal of alloys and compounds, 2013-12, Vol.581, p.66-70 [Periódico revisado por pares]Kidlington: Elsevier B.VTexto completo disponível |
10 |
Material Type: Artigo
|
![]() |
Thickness-dependent photocatalytic performance of nanocrystalline TiO2 thin films prepared by sol–gel spin coatingWu, Chung-Yi ; Lee, Yuan-Ling ; Lo, Yu-Shiu ; Lin, Chen-Jui ; Wu, Chien-HouApplied surface science, 2013-09, Vol.280, p.737-744 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |