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1
The Unreasonable Effectiveness of Deep Features as a Perceptual Metric
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The Unreasonable Effectiveness of Deep Features as a Perceptual Metric

Zhang, Richard ; Isola, Phillip ; Efros, Alexei A. ; Shechtman, Eli ; Wang, Oliver

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.586-595

IEEE

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Exploring the tradeoffs between programmability and efficiency in data-parallel accelerators
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Exploring the tradeoffs between programmability and efficiency in data-parallel accelerators

Lee, Yunsup ; Avizienis, Rimas ; Bishara, Alex ; Xia, Richard ; Lockhart, Derek ; Batten, Christopher ; Asanović, Krste

2011 38th Annual International Symposium on Computer Architecture (ISCA), 2011, p.129-140

New York, NY, USA: ACM

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3
Practical Block-Wise Neural Network Architecture Generation
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Practical Block-Wise Neural Network Architecture Generation

Zhong, Zhao ; Yan, Junjie ; Wu, Wei ; Shao, Jing ; Liu, Cheng-Lin

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.2423-2432

IEEE

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4
Anton 2: raising the bar for performance and programmability in a special-purpose molecular dynamics supercomputer
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Anton 2: raising the bar for performance and programmability in a special-purpose molecular dynamics supercomputer

Shaw, David E. ; Grossman, J. P. ; Bank, Joseph A. ; Batson, Brannon ; Butts, J. Adam ; Chao, Jack C. ; Deneroff, Martin M. ; Dror, Ron O. ; Even, Amos ; Fenton, Christopher H. ; Forte, Anthony ; Gagliardo, Joseph ; Gill, Gennette ; Greskamp, Brian ; Ho, C. Richard ; Ierardi, Douglas J. ; Iserovich, Lev ; Kuskin, Jeffrey S. ; Larson, Richard H. ; Layman, Timothy ; Lee, Li-Siang ; Lerer, Adam K. ; Li, Chester ; Killebrew, Daniel ; Mackenzie, Kenneth M. ; Mok, Shark Yeuk-Hai ; Moraes, Mark A. ; Mueller, Rolf ; Nociolo, Lawrence J. ; Peticolas, Jon L. ; Quan, Terry ; Ramot, Daniel ; Salmon, John K. ; Scarpazza, Daniele P. ; Ben Schafer, U. ; Siddique, Naseer ; Snyder, Christopher W. ; Spengler, Jochen ; Tang, Ping Tak Peter ; Theobald, Michael ; Toma, Horia ; Towles, Brian ; Vitale, Benjamin ; Wang, Stanley C. ; Young, Cliff

Proceedings of the International Conference for High Performance Computing, Networking, Storage and Analysis, 2014, p.41-53

Piscataway, NJ, USA: IEEE Press

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5
Learning Transferable Architectures for Scalable Image Recognition
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Learning Transferable Architectures for Scalable Image Recognition

Zoph, Barret ; Vasudevan, Vijay ; Shlens, Jonathon ; Le, Quoc V.

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.8697-8710

IEEE

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6
Learning to Compare: Relation Network for Few-Shot Learning
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Learning to Compare: Relation Network for Few-Shot Learning

Sung, Flood ; Yang, Yongxin ; Zhang, Li ; Xiang, Tao ; Torr, Philip H.S. ; Hospedales, Timothy M.

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.1199-1208

IEEE

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7
Heterogeneous memory architectures: A HW/SW approach for mixing die-stacked and off-package memories
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Heterogeneous memory architectures: A HW/SW approach for mixing die-stacked and off-package memories

Meswani, Mitesh R. ; Blagodurov, Sergey ; Roberts, David ; Slice, John ; Ignatowski, Mike ; Loh, Gabriel H.

2015 IEEE 21st International Symposium on High Performance Computer Architecture (HPCA), 2015, p.126-136

IEEE

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8
A Closer Look at Spatiotemporal Convolutions for Action Recognition
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A Closer Look at Spatiotemporal Convolutions for Action Recognition

Tran, Du ; Wang, Heng ; Torresani, Lorenzo ; Ray, Jamie ; LeCun, Yann ; Paluri, Manohar

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.6450-6459

IEEE

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9
Beyond the memory wall: a case for memory-centric HPC system for deep learning
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Beyond the memory wall: a case for memory-centric HPC system for deep learning

Kwon, Youngeun ; Rhu, Minsoo

2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO), 2018, p.148-161

Piscataway, NJ, USA: IEEE Press

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10
Deep Back-Projection Networks for Super-Resolution
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Deep Back-Projection Networks for Super-Resolution

Haris, Muhammad ; Shakhnarovich, Greg ; Ukita, Norimichi

2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2018, p.1664-1673

IEEE

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