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Material Type: Ata de Congresso
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FaCoY: a code-to-code search engineKim, Kisub ; Kim, Dongsun ; Bissyandé, Tegawendé F. ; Choi, Eunjong ; Li, Li ; Klein, Jacques ; Traon, Yves Le2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.946-957New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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CURE: Code-Aware Neural Machine Translation for Automatic Program RepairJiang, Nan ; Lutellier, Thibaud ; Tan, Lin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.1161-1173IEEETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Bugs.jar: a large-scale, diverse dataset of real-world Java bugsSaha, Ripon K. ; Lyu, Yingjun ; Lam, Wing ; Yoshida, Hiroaki ; Prasad, Mukul R.2018 IEEE/ACM 15th International Conference on Mining Software Repositories (MSR), 2018, p.10-13New York, NY, USA: ACMTexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Prioritizing Test Inputs for Deep Neural Networks via Mutation AnalysisWang, Zan ; You, Hanmo ; Chen, Junjie ; Zhang, Yingyi ; Dong, Xuyuan ; Zhang, Wenbin2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.397-409IEEETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Fault Localization with Code Coverage Representation LearningLi, Yi ; Wang, Shaohua ; Nguyen, Tien2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.661-673IEEETexto completo disponível |
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Material Type: Ata de Congresso
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A graph solver for the automated generation of consistent domain-specific modelsSemeráth, Oszkár ; Nagy, András Szabolcs ; Varró, Dániel2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.969-980New York, NY, USA: ACMTexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Identifying patch correctness in test-based program repairXiong, Yingfei ; Liu, Xinyuan ; Zeng, Muhan ; Zhang, Lu ; Huang, Gang2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.789-799New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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DeepLocalize: Fault Localization for Deep Neural NetworksWardat, Mohammad ; Le, Wei ; Rajan, Hridesh2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.251-262IEEETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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RobOT: Robustness-Oriented Testing for Deep Learning SystemsWang, Jingyi ; Chen, Jialuo ; Sun, Youcheng ; Ma, Xingjun ; Wang, Dongxia ; Sun, Jun ; Cheng, Peng2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE), 2021, p.300-311IEEETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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Towards practical program repair with on-demand candidate generationHua, Jinru ; Zhang, Mengshi ; Wang, Kaiyuan ; Khurshid, Sarfraz2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018, p.12-23New York, NY, USA: ACMTexto completo disponível |