Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Be/Al-based multilayer mirrors with improved reflection and spectral selectivity for solar astronomy above 17 nm wavelengthChkhalo, N.I. ; Pariev, D.E. ; Polkovnikov, V.N. ; Salashchenko, N.N. ; Shaposhnikov, R.A. ; Stroulea, I.L. ; Svechnikov, M.V. ; Vainer, Yu.A. ; Zuev, S.YuThin solid films, 2017-06, Vol.631, p.106-111 [Periódico revisado por pares]Texto completo disponível |
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Material Type: Artigo
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X-ray scattering by the fused silica surface etched by low-energy Ar ionsBarysheva, M M ; Chkhalo, N I ; Drozdov, M N ; Mikhailenko, M S ; Pestov, A E ; Salashchenko, N N ; Vainer, Y A ; Yunin, P A ; Zorina, M VJournal of X-ray science and technology, 2019-01, Vol.27 (5), p.857-870 [Periódico revisado por pares]NetherlandsTexto completo disponível |
3 |
Material Type: Artigo
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Multilayered mirrors based on La/B4C(B9C) for X-ray range near anomalous dispersion of boron (λ≈6.7nm)Andreev, S.S. ; Barysheva, M.M. ; Chkhalo, N.I. ; Gusev, S.A. ; Pestov, A.E. ; Polkovnikov, V.N ; Salashchenko, N.N. ; Shmaenok, L.A. ; Vainer, Yu.A. ; Zuev, S.YuNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2009-05, Vol.603 (1-2), p.80-82 [Periódico revisado por pares]Texto completo disponível |
4 |
Material Type: Artigo
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Ultra-short period X-ray mirrors: Production and investigationBibishkin, M.S. ; Chkhalo, N.I. ; Fraerman, A.A. ; Pestov, A.E. ; Prokhorov, K.A. ; Salashchenko, N.N. ; Vainer, Yu.A.Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2005-05, Vol.543 (1), p.333-339 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
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Material Type: Artigo
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Nash Q-learning agents in Hotelling’s model: Reestablishing equilibriumVainer, Jan ; Kukacka, JiriCommunications in nonlinear science & numerical simulation, 2021-08, Vol.99, p.105805, Article 105805 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
6 |
Material Type: Artigo
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Excess lateral photo-response caused by technological and constructive defects in the IR-sensitive hybrid microcircuitsVainer, B.GJournal of crystal growth, 2000-03, Vol.210 (1), p.356-360 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
7 |
Material Type: Artigo
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Application of the narrow spectral range InAs-FPA-based IR camera for the investigation of the interface voids in silicon wafer bondingVainer, B.G ; Kamaev, G.N ; Kurishev, G.LJournal of crystal growth, 2000-03, Vol.210 (1), p.351-355 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
8 |
Material Type: Artigo
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Line broadening mechanisms in spectra of organic amorphous solids: photon echo study of terrylene in polyisobutylene at subkelvin temperaturesZilker, S.J. ; Haarer, D. ; Vainer, Yu.G.Chemical physics letters, 1997-07, Vol.273 (3), p.232-238 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
9 |
Material Type: Artigo
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Investigation of low-temperature line broadening mechanisms in organic amorphous solids with photon echo, hole-burning and single-molecule spectroscopyZilker, S.J. ; Friebel, J. ; Haarer, D. ; Vainer, Yu.G. ; Personov, R.I.Chemical physics letters, 1998-06, Vol.289 (5-6), p.553-558 [Periódico revisado por pares]Elsevier B.VTexto completo disponível |
10 |
Material Type: Artigo
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Dephasing and diffusional linewidths in spectra of doped amorphous solids: Comparison of photon echo and single molecule spectroscopy data for terrylene in polyethyleneVainer, Yu.G. ; Plakhotnik, T.V. ; Personov, R.I.Chemical physics, 1996-09, Vol.209 (1), p.101-110 [Periódico revisado por pares]Texto completo disponível |