Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramicsChkhalo, N I ; Churin, S A ; Pestov, A E ; Salashchenko, N N ; Vainer, Yu A ; Zorina, M VOptics express, 2014-08, Vol.22 (17), p.20094-20106 [Periódico revisado por pares]United StatesTexto completo disponível |
2 |
Material Type: Artigo
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Study of oxidation processes in Mo/Be multilayersNechay, A. N. ; Chkhalo, N. I. ; Drozdov, M. N. ; Garakhin, S. A. ; Pariev, D. E. ; Polkovnikov, V. N. ; Salashchenko, N. N. ; Svechnikov, M. V. ; Vainer, Yu. A. ; Meltchakov, E. ; Delmotte, F.AIP advances, 2018-07, Vol.8 (7), p.075202-075202-12 [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
3 |
Material Type: Artigo
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Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam EpitaxyGoray, L. I. ; Pirogov, E. V. ; Sobolev, M. S. ; Ilkiv, I. V. ; Dashkov, A. S. ; Vainer, Yu. A. ; Svechnikov, M. V. ; Yunin, P. A. ; Chkhalo, N. I. ; Bouravlev, A. D.Semiconductors (Woodbury, N.Y.), 2019-12, Vol.53 (14), p.1910-1913 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
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Material Type: Artigo
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Internal Stresses in Mo/Y Multilayer MirrorsKvashennikov, D. S. ; Vainer, Yu. A. ; Zuev, S. Yu ; Polkovnikov, V. N.Surface investigation, x-ray, synchrotron and neutron techniques, 2019-03, Vol.13 (2), p.177-181 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
5 |
Material Type: Artigo
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Beryllium-Based Multilayer Mirrors for the Soft X-Ray and Extreme Ultraviolet Wavelength RangesVainer, Yu. A. ; Garakhin, S. A. ; Zuev, S. Yu ; Nechay, A. N. ; Pleshkov, R. S. ; Polkovnikov, V. N. ; Salashchenko, N. N. ; Svechnikov, M. V. ; Sertsu, M. G. ; Smertin, R. M. ; Sokolov, A. ; Chkhalo, N. I. ; Schäfers, F.Surface investigation, x-ray, synchrotron and neutron techniques, 2020, Vol.14 (1), p.124-134 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
6 |
Material Type: Artigo
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Be/Al-based multilayer mirrors with improved reflection and spectral selectivity for solar astronomy above 17 nm wavelengthChkhalo, N.I. ; Pariev, D.E. ; Polkovnikov, V.N. ; Salashchenko, N.N. ; Shaposhnikov, R.A. ; Stroulea, I.L. ; Svechnikov, M.V. ; Vainer, Yu.A. ; Zuev, S.YuThin solid films, 2017-06, Vol.631, p.106-111 [Periódico revisado por pares]Texto completo disponível |
7 |
Material Type: Artigo
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Set of Multilayer X-Ray Mirrors for a Double-Mirror Monochromator Operating in the Wavelength Range of 0.41–15.5 nmAkhsakhalyan, A. A. ; Vainer, Yu. A. ; Garakhin, S. A. ; Elina, K. A. ; Zavertkin, P. S. ; Zuev, S. Yu ; Ivlyushkin, D. V. ; Nechay, A. N. ; Nikolenko, A. D. ; Pariev, D. E. ; Pleshkov, R. S. ; Polkovnikov, V. N. ; Salashchenko, N. N. ; Svechnikov, M. V. ; Chkhalo, N. I.Surface investigation, x-ray, synchrotron and neutron techniques, 2019, Vol.13 (1), p.1-7 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
8 |
Material Type: Artigo
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Microstructure and Density of Mo Films in Multilayer Mo/Si MirrorsVainer, Yu. A. ; Garakhin, S. A. ; Polkovnikov, V. N. ; Salashchenko, N. N. ; Svechnikov, M. V. ; Chkhalo, N. I. ; Yunin, P. A.Surface investigation, x-ray, synchrotron and neutron techniques, 2019, Vol.13 (1), p.8-13 [Periódico revisado por pares]Moscow: Pleiades PublishingTexto completo disponível |
9 |
Material Type: Artigo
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Influence of barrier interlayers on the performance of Mo/Be multilayer mirrors for next-generation EUV lithographySvechnikov, M V ; Chkhalo, N I ; Gusev, S A ; Nechay, A N ; Pariev, D E ; Pestov, A E ; Polkovnikov, V N ; Tatarskiy, D A ; Salashchenko, N N ; Schäfers, F ; Sertsu, M G ; Sokolov, A ; Vainer, Y A ; Zorina, M VOptics express, 2018-12, Vol.26 (26), p.33718-33731 [Periódico revisado por pares]United StatesTexto completo disponível |
10 |
Material Type: Artigo
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Investigation of supersmooth optical surfaces and multilayer elements using soft X-ray radiationBarysheva, M. M. ; Vainer, Yu. A. ; Gribkov, B. A. ; Zorina, M. V. ; Pestov, A. E. ; Salashchenko, N. N. ; Chkhalo, N. I. ; Shcherbakov, A. V.Technical physics, 2013-09, Vol.58 (9), p.1371-1379 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |