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Single-Event Response of the SiGe HBT Operating in Inverse-Mode
Single-Event Response of the SiGe HBT Operating in Inverse-Mode
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Single-Event Response of the SiGe HBT Operating in Inverse-Mode

Phillips, S. D. ; Moen, K. A. ; Lourenco, N. E. ; Cressler, J. D.

IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.2682-2690 [Periódico revisado por pares]

New York: IEEE

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2
An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS
An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS
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An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS

Lourenco, Nelson E. ; Phillips, Stanley D. ; England, Troy D. ; Cardoso, Adilson S. ; Fleetwood, Zachary E. ; Moen, Kurt A. ; McMorrow, Dale ; Warner, Jeffrey H. ; Buchner, Stephen P. ; Paki-Amouzou, Pauline ; Pekarik, Jack ; Harame, David ; Raman, Ashok ; Turowski, Marek ; Cressler, John D.

IEEE transactions on nuclear science, 2013-12, Vol.60 (6), p.4175-4183 [Periódico revisado por pares]

New York: IEEE

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3
A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT
A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT
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A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT

Phillips, S.D. ; Thrivikraman, T. ; Appaswamy, A. ; Sutton, A.K. ; Cressler, J.D. ; Vizkelethy, G. ; Dodd, P. ; Reed, R.A.

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3393-3401 [Periódico revisado por pares]

New York: IEEE

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4
Potential economic values of low-vapor-pressure gasoline-range bio-blendstocks: Property estimation and blending optimization
Potential economic values of low-vapor-pressure gasoline-range bio-blendstocks: Property estimation and blending optimization
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Potential economic values of low-vapor-pressure gasoline-range bio-blendstocks: Property estimation and blending optimization

Jiang, Yuan ; Phillips, Steven D. ; Singh, Avantika ; Jones, Susanne B. ; Gaspar, Daniel J.

Fuel (Guildford), 2021-08, Vol.297, p.120759, Article 120759 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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5
Measuring and predicting the vapor pressure of gasoline containing oxygenates
Measuring and predicting the vapor pressure of gasoline containing oxygenates
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Measuring and predicting the vapor pressure of gasoline containing oxygenates

Gaspar, Daniel J. ; Phillips, Steven D. ; Polikarpov, Evgueni ; Albrecht, Karl O. ; Jones, Susanne B. ; George, Anthe ; Landera, Alexander ; Santosa, Daniel M. ; Howe, Daniel T. ; Baldwin, Anna G. ; Bays, J. Timothy

Fuel (Guildford), 2019-05, Vol.243 (C), p.630-644 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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6
Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs
Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs
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Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs

Pellish, J.A. ; Reed, R.A. ; McMorrow, D. ; Vizkelethy, G. ; Cavrois, V.F. ; Baggio, J. ; Paillet, P. ; Duhamel, O. ; Moen, K.A. ; Phillips, S.D. ; Diestelhorst, R.M. ; Cressler, J.D. ; Sutton, A.K. ; Raman, A. ; Turowski, M. ; Dodd, P.E. ; Alles, M.L. ; Schrimpf, R.D. ; Marshall, P.W. ; LaBel, K.A.

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3078-3084 [Periódico revisado por pares]

New York: IEEE

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7
Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits
Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits
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Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits

Najafizadeh, L. ; Phillips, S.D. ; Moen, K.A. ; Diestelhorst, R.M. ; Bellini, M. ; Saha, P.K. ; Cressler, J.D. ; Vizkelethy, G. ; Turowski, M. ; Raman, A. ; Marshall, P.W.

IEEE transactions on nuclear science, 2009-12, Vol.56 (6), p.3469-3476 [Periódico revisado por pares]

New York: IEEE

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8
Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS
Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS
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Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS

Moen, K A ; Phillips, S D ; Wilcox, E P ; Cressler, J D ; Nayfeh, H ; Sutton, A K ; Warner, J H ; Buchner, S P ; McMorrow, D ; Vizkelethy, G ; Dodd, P

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3366-3372 [Periódico revisado por pares]

New York: IEEE

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9
A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop Applications
A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop Applications
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A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop Applications

Horst, S. J. ; Phillips, S. D. ; Cressler, J. D. ; Kruckmeyer, K. ; Eddy, R. ; Aude, A. ; O'Farrell, P. ; Benyong Zhang ; Wilcox, E. ; LaBel, K.

IEEE transactions on nuclear science, 2011-12, Vol.58 (6), p.3038-3045 [Periódico revisado por pares]

New York: IEEE

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10
A Comprehensive Understanding of the Efficacy of N-Ring SEE Hardening Methodologies in SiGe HBTs
A Comprehensive Understanding of the Efficacy of N-Ring SEE Hardening Methodologies in SiGe HBTs
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A Comprehensive Understanding of the Efficacy of N-Ring SEE Hardening Methodologies in SiGe HBTs

Phillips, S D ; Moen, K A ; Najafizadeh, L ; Diestelhorst, R M ; Sutton, A K ; Cressler, J D ; Vizkelethy, G ; Dodd, P E ; Marshall, P W

IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3400-3406 [Periódico revisado por pares]

New York: IEEE

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