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Material Type: Artigo
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DASH: a program for crystal structure determination from powder diffraction dataShankland, Kenneth ; Pidcock, Elna ; Van De Streek, Jacco ; David, William I. F. ; Motherwell, W. D. Samuel ; Cole, Jason C.Journal of applied crystallography, 2006-12, Vol.39 (6), p.910-915 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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Single-crystal structure validation with the program PLATONSpek, A. L.Journal of applied crystallography, 2003-02, Vol.36 (1), p.7-13 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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FOX, `free objects for crystallography': a modular approach to ab initio structure determination from powder diffractionFavre-Nicolin, Vincent ; Černý, RadovanJournal of applied crystallography, 2002-12, Vol.35 (6), p.734-743 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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EXPGUI, a graphical user interface for GSASToby, Brian H.Journal of applied crystallography, 2001-04, Vol.34 (2), p.210-213 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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An intensity evaluation method: EVAL-14Duisenberg, Albert J. M. ; Kroon-Batenburg, Loes M. J. ; Schreurs, Antoine M. M.Journal of applied crystallography, 2003-04, Vol.36 (2), p.220-229 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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SHADE web server for estimation of hydrogen anisotropic displacement parametersMadsen, Anders ØstergaardJournal of applied crystallography, 2006-10, Vol.39 (5), p.757-758 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Blackwell Publishing LtdTexto completo disponível |
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Material Type: Artigo
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Stress analysis of polycrystalline thin films and surface regions by X-ray diffractionLigot, J. ; Welzel, U. ; Lamparter, P. ; Vermeulen, A. C. ; Mittemeijer, E. J.Journal of applied crystallography, 2005-02, Vol.38 (1), p.1-29 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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OLEX: new software for visualization and analysis of extended crystal structuresDolomanov, Oleg V. ; Blake, Alexander J. ; Champness, Neil R. ; Schröder, MartinJournal of applied crystallography, 2003-10, Vol.36 (5), p.1283-1284 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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Indexing of powder diffraction patterns by iterative use of singular value decompositionCoelho, A. A.Journal of applied crystallography, 2003-02, Vol.36 (1), p.86-95 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International PublishersTexto completo disponível |
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Material Type: Artigo
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SIR97: a new tool for crystal structure determination and refinementAltomare, Angela ; Burla, Maria Cristina ; Camalli, Mercedes ; Cascarano, Giovanni Luca ; Giacovazzo, Carmelo ; Guagliardi, Antonietta ; Moliterni, Anna Grazia Giuseppina ; Polidori, Giampiero ; Spagna, RiccardoJournal of applied crystallography, 1999-02, Vol.32 (1), p.115-119 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |