Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Cathodoluminescence of Ge- Clusters in Silica LayersSalh, R ; Fitting, L ; Fitting, H-JMicroscopy and microanalysis, 2006-08, Vol.12 (S02), p.1532-1533 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
2 |
Material Type: Artigo
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Low Energy Electron Scattering and Electrical Charging in Non-conductive SpecimenFitting, H.-J.Microscopy and microanalysis, 2003-09, Vol.9 (S03), p.102-103 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
3 |
Material Type: Artigo
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Monte Carlo Modeling of Electron Scattering in Nonconductive SpecimensFitting, H.-J. ; Schreiber, E. ; Glavatskikh, I.A.Microscopy and microanalysis, 2004-12, Vol.10 (6), p.764-770 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
4 |
Material Type: Artigo
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EFTEM, EELS, and Cathodoluminescence in Si-implanted SiO2 LayersFitting, H-J ; Kourkoutis, L Fitting ; Salh, R ; Schmidt, BMicroscopy and microanalysis, 2009-07, Vol.15 (S2), p.1104-1105 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
5 |
Material Type: Artigo
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SEM Contrast of Semi-insulating Compound MaterialsFitting, H-J ; Kovacs, JZMicroscopy and microanalysis, 2009-07, Vol.15 (S2), p.1106-1107 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
6 |
Material Type: Artigo
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Electron Beam Induced Defects in SiO2Fitting, H.-J. ; Barfels, T. ; von Czarnowski, A. ; Ziems, T.Microscopy and microanalysis, 2003-09, Vol.9 (S03), p.360-361 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
7 |
Material Type: Artigo
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Cathodoluminescence of Defects, Interstitial Molecules, and Clusters in SilicaFitting, H-J ; Salh, R ; Kourkoutis, L FittingMicroscopy and microanalysis, 2007-08, Vol.13 (S02), p.1378-1379 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
8 |
Material Type: Artigo
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Cathodoluminescence of Ion-Implanted Silica LayersSalh, R ; Fitting, H-J ; Kourkoutis, L Fitting ; Schmidt, BMicroscopy and microanalysis, 2007-09, Vol.13 (S03), p.328-329 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
9 |
Material Type: Artigo
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Selfconsistent Electron Beam Charging of Non-Conductive Specimen in SEM and ESEMFitting, H-J ; Touzin, MMicroscopy and microanalysis, 2006-08, Vol.12 (S02), p.1450-1451 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |
10 |
Material Type: Artigo
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EDX and Cathodoluminecence Depth Analysis in Ion-implanted SiO2 LayersFitting, H.-J. ; Gaber, M. ; Barfels, T.Microscopy and microanalysis, 2003-09, Vol.9 (S03), p.104-105 [Periódico revisado por pares]New York, USA: Cambridge University PressTexto completo disponível |