Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Outros
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The abcd Reliability Growth ModelJones, Harry WAmes Research Center 2024Texto completo disponível |
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2 |
Material Type: Outros
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Evaluation of Ultrasonic Battery Inspection TechniquesWebster, Matt ; Frankforter, Erik ; Juarez, Peter ; Campbell, AndrewLangley Research Center 2023Texto completo disponível |
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3 |
Material Type: Outros
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Assessment of Aggregate Risk for JWSTLeitner, Jesse ; Hyde, TupperGoddard Space Flight Center 2022Texto completo disponível |
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4 |
Material Type: Outros
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Adaptive IV&V for Increasingly Complex Software SystemsDeadrick, Wesley W ; Stanton, William Michael ; Thorn, Scott Tyler ; Ullom, Lawrence C ; Casdorph, Van AGoddard Space Flight Center 2022Texto completo disponível |
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5 |
Material Type: Outros
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Assessing Risk Due to Small Sample Size in Probability of Detection Analysis Using Tolerance IntervalsKoshti, AjayJohnson Space Center: International Society for Optics and Photonics 2022Texto completo disponível |
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6 |
Material Type: Outros
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Breakdown in Tantalum CapacitorsTeverovsky, AlexanderGoddard Space Flight Center: NASA Electronic Parts and Packaging (NEPP) Program 2021Texto completo disponível |
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7 |
Material Type: Outros
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Optoelectronics for Space Flight InstrumentsOtt, Melanie N.Goddard Space Flight Center 2020Texto completo disponível |
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8 |
Material Type: Outros
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Building a Digital Twin for NASA's Nondestructive Evaluation CapabilityBookhart, Bryan ; Burke, EricLangley Research Center 2020Texto completo disponível |
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9 |
Material Type: Outros
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IV&V Assurance Case Design for Artemis IIWhitman, Gerek ; Amoroso, Paul ; Black, Gregory ; Marculaitis-Granger, Deneen ; Smith, Justin ; Bradbury, John ; Deadrick, WesGoddard Space Flight Center 2020Texto completo disponível |
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10 |
Material Type: Outros
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