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1
The abcd Reliability Growth Model
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The abcd Reliability Growth Model

Jones, Harry W

Ames Research Center 2024

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Evaluation of Ultrasonic Battery Inspection Techniques
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Evaluation of Ultrasonic Battery Inspection Techniques

Webster, Matt ; Frankforter, Erik ; Juarez, Peter ; Campbell, Andrew

Langley Research Center 2023

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Assessment of Aggregate Risk for JWST
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Assessment of Aggregate Risk for JWST

Leitner, Jesse ; Hyde, Tupper

Goddard Space Flight Center 2022

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Adaptive IV&V for Increasingly Complex Software Systems
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Adaptive IV&V for Increasingly Complex Software Systems

Deadrick, Wesley W ; Stanton, William Michael ; Thorn, Scott Tyler ; Ullom, Lawrence C ; Casdorph, Van A

Goddard Space Flight Center 2022

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5
Assessing Risk Due to Small Sample Size in Probability of Detection Analysis Using Tolerance Intervals
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Assessing Risk Due to Small Sample Size in Probability of Detection Analysis Using Tolerance Intervals

Koshti, Ajay

Johnson Space Center: International Society for Optics and Photonics 2022

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6
Breakdown in Tantalum Capacitors
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Breakdown in Tantalum Capacitors

Teverovsky, Alexander

Goddard Space Flight Center: NASA Electronic Parts and Packaging (NEPP) Program 2021

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7
Optoelectronics for Space Flight Instruments
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Optoelectronics for Space Flight Instruments

Ott, Melanie N.

Goddard Space Flight Center 2020

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8
Building a Digital Twin for NASA's Nondestructive Evaluation Capability
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Building a Digital Twin for NASA's Nondestructive Evaluation Capability

Bookhart, Bryan ; Burke, Eric

Langley Research Center 2020

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9
IV&V Assurance Case Design for Artemis II
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IV&V Assurance Case Design for Artemis II

Whitman, Gerek ; Amoroso, Paul ; Black, Gregory ; Marculaitis-Granger, Deneen ; Smith, Justin ; Bradbury, John ; Deadrick, Wes

Goddard Space Flight Center 2020

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10
Risk-Based SMA
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Risk-Based SMA

Leitner, Jesse A.

Goddard Space Flight Center 2020

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