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Use development of functional materials in the leaves of Perilla frutescens (L.) Britton var. acuta Kudo (red perilla) with Japanese dietary pickled plum (Umeboshi)
Use development of functional materials in the leaves of Perilla frutescens (L.) Britton var. acuta Kudo (red perilla) with Japanese dietary pickled plum (Umeboshi)
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Use development of functional materials in the leaves of Perilla frutescens (L.) Britton var. acuta Kudo (red perilla) with Japanese dietary pickled plum (Umeboshi)

Sawabe, A ; Satake, T ; Aizawa, R ; Ozeki, C ; Hamada, Y ; Komemushi, S

Planta Medica, 2008, Vol.74 (9) [Periódico revisado por pares]

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Inspection performances of the electron beam inspection system based on projection electron microscopy
Inspection performances of the electron beam inspection system based on projection electron microscopy
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Inspection performances of the electron beam inspection system based on projection electron microscopy

Nagahama, Ichirota ; Onishi, Atsushi ; Yamazaki, Yuichiro ; Satake, Tohru ; Noji, Nobuharu

Proceedings of SPIE, 2004, Vol.5375, p.921-928

SPIE

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3
Metrics for detection of QoS degradation over wireless LAN
Metrics for detection of QoS degradation over wireless LAN
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Metrics for detection of QoS degradation over wireless LAN

Matsukawa, T. ; Satake, T. ; Yamada, J.

The 2005 Symposium on Applications and the Internet, 2005, p.198-203

IEEE

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4
Electron beam inspection system for semiconductor wafer based on projection electron microscopy: II
Electron beam inspection system for semiconductor wafer based on projection electron microscopy: II
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Electron beam inspection system for semiconductor wafer based on projection electron microscopy: II

Satake, Tohru ; Noji, Nobuharu ; Murakami, Takeshi ; Tsujimura, Manabu ; Nagahama, Ichirota ; Yamazaki, Yuichiro ; Onishi, Atsushi

Proc. SPIE, 2005, Vol.5752, p.1219-1226

Bellingham WA: SPIE

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5
Multifiber connector end face attributes for optimal connector performance
Multifiber connector end face attributes for optimal connector performance
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Multifiber connector end face attributes for optimal connector performance

Kevern, J. ; Harper, D. ; Knasel, D. ; Knight, K. ; Satake, T.

1996 Proceedings 46th Electronic Components and Technology Conference, 1996, p.936-941

IEEE

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6
Inactivation of microorganisms by pulsed high voltage application
Inactivation of microorganisms by pulsed high voltage application
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Inactivation of microorganisms by pulsed high voltage application

Matsumoto, Y. ; Shioji, N. ; Satake, T. ; Sakuma, A.

Conference Record of the 1991 IEEE Industry Applications Society Annual Meeting, 1991, p.652-659 vol.1

IEEE

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7
Highly reliable interconnect integration of Cu and low-k organic polymer based on fine CD controls
Highly reliable interconnect integration of Cu and low-k organic polymer based on fine CD controls
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Highly reliable interconnect integration of Cu and low-k organic polymer based on fine CD controls

Nishioka, Y. ; Tomohisa, S. ; Toyoda, Y. ; Fukada, T. ; Satake, T. ; Matsuura, M. ; Domae, S. ; Ohsaki, A.

Proceedings of the IEEE 2001 International Interconnect Technology Conference (Cat. No.01EX461), 2001, p.54-56

IEEE

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8
Single-mode multifiber connector design and performance
Single-mode multifiber connector design and performance
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Single-mode multifiber connector design and performance

Satake, T. ; Tatsuno, T. ; Ouchi, Y. ; Knasel, D. ; Knight, K. ; Lundberg, J. ; Keller, D.

1996 Proceedings 46th Electronic Components and Technology Conference, 1996, p.494-499

IEEE

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9
MT multifiber connectors and new applications
MT multifiber connectors and new applications
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MT multifiber connectors and new applications

Satake, T. ; Arikawa, T. ; Blubaugh, P.W. ; Parsons, C. ; Uchida, T.K.

1994 Proceedings. 44th Electronic Components and Technology Conference, 1994, p.994-999

IEEE

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10
Basic study of occurrence frequency of bowel sounds after food ingestion
Basic study of occurrence frequency of bowel sounds after food ingestion
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Basic study of occurrence frequency of bowel sounds after food ingestion

Sakata, O. ; Suzuki, Yutaka ; Matsuda, Kenichi ; Satake, T.

TENCON 2011 - 2011 IEEE Region 10 Conference, 2011, p.1203-1206

IEEE

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