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Solid State Excitation‐Emission Spectroscopy for the Non‐Destructive Analysis of Band‐Gap & Defect States in Inorganic and Organic Semiconductors
Solid State Excitation‐Emission Spectroscopy for the Non‐Destructive Analysis of Band‐Gap & Defect States in Inorganic and Organic Semiconductors
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Solid State Excitation‐Emission Spectroscopy for the Non‐Destructive Analysis of Band‐Gap & Defect States in Inorganic and Organic Semiconductors

Oliver, Daniel J. ; Volkov, Victor V. ; Perry, Carole C.

Advanced materials interfaces, 2023-01, Vol.10 (3), p.n/a [Periódico revisado por pares]

Weinheim: John Wiley & Sons, Inc

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12
Sensitive Characterization of the Graphene Transferred onto Varied Si Wafer Surfaces via Terahertz Emission Spectroscopy and Microscopy (TES/LTEM)
Sensitive Characterization of the Graphene Transferred onto Varied Si Wafer Surfaces via Terahertz Emission Spectroscopy and Microscopy (TES/LTEM)
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Sensitive Characterization of the Graphene Transferred onto Varied Si Wafer Surfaces via Terahertz Emission Spectroscopy and Microscopy (TES/LTEM)

Yang, Dongxun ; Laarman, Jesse Henri ; Tonouchi, Masayoshi

Materials, 2024-04, Vol.17 (7), p.1497 [Periódico revisado por pares]

Switzerland: MDPI AG

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13
A von Hamos spectrometer for in situ sulfur speciation by non-resonant sulfur Kα emission spectroscopy
A von Hamos spectrometer for in situ sulfur speciation by non-resonant sulfur Kα emission spectroscopy
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A von Hamos spectrometer for in situ sulfur speciation by non-resonant sulfur Kα emission spectroscopy

Kuzmenko, Dzulija ; Vogelsang, Urs ; Hitz, Stephan ; Müller, David ; Clark, Adam H. ; Kinschel, Dominik ; Czapla-Masztafiak, Joanna ; Milne, Christopher ; Szlachetko, Jakub ; Nachtegaal, Maarten

Journal of analytical atomic spectrometry, 2019-10, Vol.34 (10), p.2105-2111 [Periódico revisado por pares]

London: Royal Society of Chemistry

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14
Investigation of laser‐produced plasma multistructuring by floating probe measurements and optical emission spectroscopy
Investigation of laser‐produced plasma multistructuring by floating probe measurements and optical emission spectroscopy
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Investigation of laser‐produced plasma multistructuring by floating probe measurements and optical emission spectroscopy

Irimiciuc, Stefan A. ; Chertopalov, Sergii ; Craciun, Valentin ; Novotný, Michal ; Lancok, Jan

Plasma processes and polymers, 2020-11, Vol.17 (11), p.n/a [Periódico revisado por pares]

Weinheim: Wiley Subscription Services, Inc

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15
Parametric optimization and spectral line selection for liquid sampling-atmospheric pressure glow discharge - optical emission spectroscopy
Parametric optimization and spectral line selection for liquid sampling-atmospheric pressure glow discharge - optical emission spectroscopy
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Parametric optimization and spectral line selection for liquid sampling-atmospheric pressure glow discharge - optical emission spectroscopy

Hall, Katja A ; Marcus, R. Kenneth

Journal of analytical atomic spectrometry, 2019-12, Vol.34 (12), p.2428-2439 [Periódico revisado por pares]

London: Royal Society of Chemistry

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16
Simulating Valence-to-Core X‑ray Emission Spectroscopy of Transition Metal Complexes with Time-Dependent Density Functional Theory
Simulating Valence-to-Core X‑ray Emission Spectroscopy of Transition Metal Complexes with Time-Dependent Density Functional Theory
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Simulating Valence-to-Core X‑ray Emission Spectroscopy of Transition Metal Complexes with Time-Dependent Density Functional Theory

Zhang, Yu ; Mukamel, Shaul ; Khalil, Munira ; Govind, Niranjan

Journal of chemical theory and computation, 2015-12, Vol.11 (12), p.5804-5809 [Periódico revisado por pares]

United States: American Chemical Society

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17
Optical Emission Spectroscopy Analysis of Microwave Plasma‐Enhanced Chemical Vapor Deposition Systems Dynamic Gas Response
Optical Emission Spectroscopy Analysis of Microwave Plasma‐Enhanced Chemical Vapor Deposition Systems Dynamic Gas Response
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Optical Emission Spectroscopy Analysis of Microwave Plasma‐Enhanced Chemical Vapor Deposition Systems Dynamic Gas Response

Lambert, Nicolas ; Sung, Kil-Dong ; Mortet, Vincent

Physica status solidi. A, Applications and materials science, 2023-02, Vol.220 (4), p.n/a [Periódico revisado por pares]

Weinheim: Wiley Subscription Services, Inc

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18
Phosphorus Kβ X-ray emission spectroscopy detects non-covalent interactions of phosphate biomolecules in situ
Phosphorus Kβ X-ray emission spectroscopy detects non-covalent interactions of phosphate biomolecules in situ
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Phosphorus Kβ X-ray emission spectroscopy detects non-covalent interactions of phosphate biomolecules in situ

Mathe, Zachary ; McCubbin Stepanic, Olivia ; Peredkov, Sergey ; DeBeer, Serena

Chemical science (Cambridge), 2021-04, Vol.12 (22), p.7888-7901 [Periódico revisado por pares]

Cambridge: Royal Society of Chemistry

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19
Comparison of total reflection X-ray fluorescence spectroscopy and inductively coupled plasma  atomic emission spectroscopy for thequantification of gold nanoparticle uptake
Comparison of total reflection X-ray fluorescence spectroscopy and inductively coupled plasma  atomic emission spectroscopy for thequantification of gold nanoparticle uptake
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Comparison of total reflection X-ray fluorescence spectroscopy and inductively coupled plasma  atomic emission spectroscopy for thequantification of gold nanoparticle uptake

Mankovskii, Gabriella ; Pejović-Milić, Ana

Spectrochimica acta. Part B: Atomic spectroscopy, 2020-02, Vol.164, p.105764, Article 105764 [Periódico revisado por pares]

Oxford: Elsevier B.V

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20
Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy
Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy
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Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy

Verma, Hina ; Le Guen, Karine ; Delaunay, Renaud ; Ismail, Iyas ; Ilakovac, Vita ; Rueff, Jean Pascal ; Zheng, Yunlin Jacques ; Jonnard, Philippe

Surface and interface analysis, 2021-12, Vol.53 (12), p.1043-1047 [Periódico revisado por pares]

Bognor Regis: Wiley Subscription Services, Inc

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