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1
PROCESS TO OBTAIN OXIDE LAYERS ON ZIRCONIUM, HAFNIUM, AND THEIR ALLOYS
PROCESS TO OBTAIN OXIDE LAYERS ON ZIRCONIUM, HAFNIUM, AND THEIR ALLOYS
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PROCESS TO OBTAIN OXIDE LAYERS ON ZIRCONIUM, HAFNIUM, AND THEIR ALLOYS

Loriers, H. ; Tissier, J.

France 1970

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2
Device for the preparation of thin insulating layers by means of ion sputtering
Device for the preparation of thin insulating layers by means of ion sputtering
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Device for the preparation of thin insulating layers by means of ion sputtering

Fiedler, O. ; Weissmantel, C. ; Reisse, G.

Germany 1970

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3
PROCESS FOR IMPROVING THE PROPERTIES OF SYNTHETIC FIBRES, FABRICS, FILMS AND MOULDED ARTICLES BY IRRADIATION WITH RADIOACTIVE RAYS
PROCESS FOR IMPROVING THE PROPERTIES OF SYNTHETIC FIBRES, FABRICS, FILMS AND MOULDED ARTICLES BY IRRADIATION WITH RADIOACTIVE RAYS
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PROCESS FOR IMPROVING THE PROPERTIES OF SYNTHETIC FIBRES, FABRICS, FILMS AND MOULDED ARTICLES BY IRRADIATION WITH RADIOACTIVE RAYS

Muroi, T. ; Onishi, S. ; Morimoto, S. ; Yamauchi, A.

United States 1964

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4
INDUCTION TRANSDUCER FOR DETECTING THE VARIATIONS IN THE THICKNESS OF HIGHLY CONDUCTING LIQUID FILMS AT HIGH TEMPERATURE
INDUCTION TRANSDUCER FOR DETECTING THE VARIATIONS IN THE THICKNESS OF HIGHLY CONDUCTING LIQUID FILMS AT HIGH TEMPERATURE
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INDUCTION TRANSDUCER FOR DETECTING THE VARIATIONS IN THE THICKNESS OF HIGHLY CONDUCTING LIQUID FILMS AT HIGH TEMPERATURE

Blanc, R. ; Pouvreau, M.

France 1972

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5
APPARATUS AUTOMATICALLY PREPARING PHOTOGRAPHIC DOSIMETERS FOR DEVELOPMENT
APPARATUS AUTOMATICALLY PREPARING PHOTOGRAPHIC DOSIMETERS FOR DEVELOPMENT
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APPARATUS AUTOMATICALLY PREPARING PHOTOGRAPHIC DOSIMETERS FOR DEVELOPMENT

Duport, P. ; Eschbach, J. ; Marchal, P.

France 1971

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6
EQUIPMENT FOR SEPARATING A FLAT DEVICE FROM ITS PROTECTIVE WRAPPING
EQUIPMENT FOR SEPARATING A FLAT DEVICE FROM ITS PROTECTIVE WRAPPING
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EQUIPMENT FOR SEPARATING A FLAT DEVICE FROM ITS PROTECTIVE WRAPPING

Duport, P. ; Eschbach, J. ; Marchal, P.

France 1971

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7
EQUIPMENT FOR MEASURING THE THICKNESS OF A THIN FILM OF HYDROGENATED MATTER USING THE SLOWING DOWN OF NEUTRONS
EQUIPMENT FOR MEASURING THE THICKNESS OF A THIN FILM OF HYDROGENATED MATTER USING THE SLOWING DOWN OF NEUTRONS
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EQUIPMENT FOR MEASURING THE THICKNESS OF A THIN FILM OF HYDROGENATED MATTER USING THE SLOWING DOWN OF NEUTRONS

Baron, J.P.

France 1971

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8
METHOD FOR MEASURING THE THICKNESS OF THIN FILMS UNDER VACUUM
METHOD FOR MEASURING THE THICKNESS OF THIN FILMS UNDER VACUUM
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METHOD FOR MEASURING THE THICKNESS OF THIN FILMS UNDER VACUUM

Levenes, G.

France 1971

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9
IMPROVEMENTS TO EQUIPMENTS FOR MEASURING THICKNESS BY BACKSCATTERING
IMPROVEMENTS TO EQUIPMENTS FOR MEASURING THICKNESS BY BACKSCATTERING
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IMPROVEMENTS TO EQUIPMENTS FOR MEASURING THICKNESS BY BACKSCATTERING

Levenes, G.

France 1971

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10
AUTOMATIC SELECTIONING APPARATUS
AUTOMATIC SELECTIONING APPARATUS
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AUTOMATIC SELECTIONING APPARATUS

Duport, P. ; Esbach, M. ; Marchal, P. ; Portal, G.

France 1971

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