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11 |
Material Type: Artigo
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LSTM Fully Convolutional Networks for Time Series ClassificationKarim, Fazle ; Majumdar, Somshubra ; Darabi, Houshang ; Chen, ShunIEEE access, 2018-01, Vol.6, p.1662-1669 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
12 |
Material Type: Artigo
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A Survey on IoT Security: Application Areas, Security Threats, and Solution ArchitecturesHassija, Vikas ; Chamola, Vinay ; Saxena, Vikas ; Jain, Divyansh ; Goyal, Pranav ; Sikdar, BiplabIEEE access, 2019, Vol.7, p.82721-82743 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
13 |
Material Type: Artigo
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Peeking Inside the Black-Box: A Survey on Explainable Artificial Intelligence (XAI)Adadi, Amina ; Berrada, MohammedIEEE access, 2018-01, Vol.6, p.52138-52160 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
14 |
Material Type: Artigo
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Review of Deep Learning Algorithms and ArchitecturesShrestha, Ajay ; Mahmood, AusifIEEE access, 2019, Vol.7, p.53040-53065 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
15 |
Material Type: Artigo
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Machine Learning and Deep Learning Methods for CybersecurityXin, Yang ; Kong, Lingshuang ; Liu, Zhi ; Chen, Yuling ; Li, Yanmiao ; Zhu, Hongliang ; Gao, Mingcheng ; Hou, Haixia ; Wang, ChunhuaIEEE access, 2018-01, Vol.6, p.35365-35381 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
16 |
Material Type: Artigo
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Explainable Machine Learning for Scientific Insights and DiscoveriesRoscher, Ribana ; Bohn, Bastian ; Duarte, Marco F. ; Garcke, JochenIEEE access, 2020, Vol.8, p.42200-42216 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
17 |
Material Type: Artigo
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Smart Factory of Industry 4.0: Key Technologies, Application Case, and ChallengesChen, Baotong ; Wan, Jiafu ; Shu, Lei ; Li, Peng ; Mukherjee, Mithun ; Yin, BoxingIEEE access, 2018-01, Vol.6, p.6505-6519 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
18 |
Material Type: Artigo
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Benchmark Analysis of Representative Deep Neural Network ArchitecturesBianco, Simone ; Cadene, Remi ; Celona, Luigi ; Napoletano, PaoloIEEE access, 2018, Vol.6, p.64270-64277 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
19 |
Material Type: Artigo
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Deep Learning Applications in Medical Image AnalysisKer, Justin ; Wang, Lipo ; Rao, Jai ; Lim, TchoyosonIEEE access, 2018-01, Vol.6, p.9375-9389 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
20 |
Material Type: Artigo
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Plant Disease Detection and Classification by Deep Learning-A ReviewLi, Lili ; Zhang, Shujuan ; Wang, BinIEEE access, 2021, Vol.9, p.56683-56698 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |