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Refinado por: Nome da Publicação: Journal Of Applied Physics remover idioma: Japonês remover
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11
Edge effects on the electronic properties of phosphorene nanoribbons
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Edge effects on the electronic properties of phosphorene nanoribbons

Peng, Xihong ; Copple, Andrew ; Wei, Qun

Journal of applied physics, 2014-10, Vol.116 (14) [Periódico revisado por pares]

Melville: American Institute of Physics

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12
Inverse geometry for grating-based x-ray phase-contrast imaging
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Inverse geometry for grating-based x-ray phase-contrast imaging

Donath, Tilman ; Chabior, Michael ; Pfeiffer, Franz ; Bunk, Oliver ; Reznikova, Elena ; Mohr, Juergen ; Hempel, Eckhard ; Popescu, Stefan ; Hoheisel, Martin ; Schuster, Manfred ; Baumann, Joachim ; David, Christian

Journal of applied physics, 2009-09, Vol.106 (5), p.054703-054703-7 [Periódico revisado por pares]

United States: American Institute of Physics

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13
Short-wavelength interband cascade infrared photodetectors operating above room temperature
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Short-wavelength interband cascade infrared photodetectors operating above room temperature

Lotfi, Hossein ; Li, Lu ; Lei, Lin ; Jiang, Yuchao ; Yang, Rui Q. ; Klem, John F. ; Johnson, Matthew B.

Journal of applied physics, 2016-01, Vol.119 (2) [Periódico revisado por pares]

Melville: American Institute of Physics

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14
Coherent femtosecond low-energy single-electron pulses for time-resolved diffraction and imaging: A numerical study
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Coherent femtosecond low-energy single-electron pulses for time-resolved diffraction and imaging: A numerical study

Paarmann, A. ; Gulde, M. ; Müller, M. ; Schäfer, S. ; Schweda, S. ; Maiti, M. ; Xu, C. ; Hohage, T. ; Schenk, F. ; Ropers, C. ; Ernstorfer, R.

Journal of applied physics, 2012-12, Vol.112 (11) [Periódico revisado por pares]

United States

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15
Bi-alkali antimonide photocathode growth: An X-ray diffraction study
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Bi-alkali antimonide photocathode growth: An X-ray diffraction study

Schubert, Susanne ; Wong, Jared ; Feng, Jun ; Karkare, Siddharth ; Padmore, Howard ; Ruiz-Osés, Miguel ; Smedley, John ; Muller, Erik ; Ding, Zihao ; Gaowei, Mengjia ; Attenkofer, Klaus ; Liang, Xue ; Xie, Junqi ; Kühn, Julius

Journal of applied physics, 2016-07, Vol.120 (3) [Periódico revisado por pares]

Melville: American Institute of Physics

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16
Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor
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Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

Holloway, Christopher L. ; Simons, Matt T. ; Gordon, Joshua A. ; Dienstfrey, Andrew ; Anderson, David A. ; Raithel, Georg

Journal of applied physics, 2017-06, Vol.121 (23) [Periódico revisado por pares]

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17
Helium bubble bursting in tungsten
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Helium bubble bursting in tungsten

Sefta, Faiza ; Juslin, Niklas ; Wirth, Brian D.

Journal of applied physics, 2013-12, Vol.114 (24) [Periódico revisado por pares]

Melville: American Institute of Physics

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18
Solar energy conversion via hot electron internal photoemission in metallic nanostructures: Efficiency estimates
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Solar energy conversion via hot electron internal photoemission in metallic nanostructures: Efficiency estimates

Leenheer, Andrew J. ; Narang, Prineha ; Lewis, Nathan S. ; Atwater, Harry A.

Journal of applied physics, 2014-04, Vol.115 (13) [Periódico revisado por pares]

Melville: American Institute of Physics

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19
Effect of valence electron concentration on stability of fcc or bcc phase in high entropy alloys
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Effect of valence electron concentration on stability of fcc or bcc phase in high entropy alloys

Guo, Sheng ; Ng, Chun ; Lu, Jian ; Liu, C. T.

Journal of applied physics, 2011-05, Vol.109 (10), p.103505-103505-5 [Periódico revisado por pares]

American Institute of Physics

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20
LuAG:Ce fibers for high energy calorimetry
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LuAG:Ce fibers for high energy calorimetry

Dujardin, C. ; Mancini, C. ; Amans, D. ; Ledoux, G. ; Abler, D. ; Auffray, E. ; Lecoq, P. ; Perrodin, D. ; Petrosyan, A. ; Ovanesyan, K. L.

Journal of applied physics, 2010-07, Vol.108 (1), p.013510-013510-7 [Periódico revisado por pares]

United States: American Institute of Physics

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