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1
Nonlinear Process Fault Diagnosis Based on Serial Principal Component Analysis
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Nonlinear Process Fault Diagnosis Based on Serial Principal Component Analysis

Deng, Xiaogang ; Tian, Xuemin ; Chen, Sheng ; Harris, Chris J.

IEEE transaction on neural networks and learning systems, 2018-03, Vol.29 (3), p.560-572

United States: IEEE

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Learning Temporal Information for Brain-Computer Interface Using Convolutional Neural Networks
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Learning Temporal Information for Brain-Computer Interface Using Convolutional Neural Networks

Sakhavi, Siavash ; Guan, Cuntai ; Yan, Shuicheng

IEEE transaction on neural networks and learning systems, 2018-11, Vol.29 (11), p.5619-5629

United States: IEEE

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Deep Subdomain Adaptation Network for Image Classification
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Deep Subdomain Adaptation Network for Image Classification

Zhu, Yongchun ; Zhuang, Fuzhen ; Wang, Jindong ; Ke, Guolin ; Chen, Jingwu ; Bian, Jiang ; Xiong, Hui ; He, Qing

IEEE transaction on neural networks and learning systems, 2021-04, Vol.32 (4), p.1713-1722

United States: IEEE

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4
ShengBTE: A solver of the Boltzmann transport equation for phonons
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ShengBTE: A solver of the Boltzmann transport equation for phonons

Li, Wu ; Carrete, Jesús ; A. Katcho, Nebil ; Mingo, Natalio

Computer physics communications, 2014-06, Vol.185 (6), p.1747-1758 [Periódico revisado por pares]

Elsevier B.V

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5
On the Complexity of Neural Network Classifiers: A Comparison Between Shallow and Deep Architectures
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On the Complexity of Neural Network Classifiers: A Comparison Between Shallow and Deep Architectures

Bianchini, Monica ; Scarselli, Franco

IEEE transaction on neural networks and learning systems, 2014-08, Vol.25 (8), p.1553-1565

New York, NY: IEEE

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6
Feature Selection Based on Structured Sparsity: A Comprehensive Study
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Feature Selection Based on Structured Sparsity: A Comprehensive Study

Gui, Jie ; Sun, Zhenan ; Ji, Shuiwang ; Tao, Dacheng ; Tan, Tieniu

IEEE transaction on neural networks and learning systems, 2017-07, Vol.28 (7), p.1490-1507

United States: IEEE

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7
Deep Learning in Microscopy Image Analysis: A Survey
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Deep Learning in Microscopy Image Analysis: A Survey

Xing, Fuyong ; Xie, Yuanpu ; Su, Hai ; Liu, Fujun ; Yang, Lin

IEEE transaction on neural networks and learning systems, 2018-10, Vol.29 (10), p.4550-4568

United States: IEEE

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8
Deep Neural Network for Structural Prediction and Lane Detection in Traffic Scene
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Deep Neural Network for Structural Prediction and Lane Detection in Traffic Scene

Jun Li ; Xue Mei ; Prokhorov, Danil ; Dacheng Tao

IEEE transaction on neural networks and learning systems, 2017-03, Vol.28 (3), p.690-703

United States: IEEE

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9
Segmentation of Nuclei in Histopathology Images by Deep Regression of the Distance Map
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Segmentation of Nuclei in Histopathology Images by Deep Regression of the Distance Map

Naylor, Peter ; Lae, Marick ; Reyal, Fabien ; Walter, Thomas

IEEE transactions on medical imaging, 2019-02, Vol.38 (2), p.448-459

United States: IEEE

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10
Optimal and Autonomous Control Using Reinforcement Learning: A Survey
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Optimal and Autonomous Control Using Reinforcement Learning: A Survey

Kiumarsi, Bahare ; Vamvoudakis, Kyriakos G. ; Modares, Hamidreza ; Lewis, Frank L.

IEEE transaction on neural networks and learning systems, 2018-06, Vol.29 (6), p.2042-2062

United States: IEEE

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