Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x raysRichard, M.-I. ; Favre-Nicolin, V. ; Renaud, G. ; Schülli, T. U. ; Priester, C. ; Zhong, Z. ; Metzger, T.-H.Applied physics letters, 2009-01, Vol.94 (1), p.013112-1-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
2 |
Material Type: Artigo
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Strain and composition distribution in uncapped SiGe islands from x-ray diffractionStangl, J. ; Daniel, A. ; Holý, V. ; Roch, T. ; Bauer, G. ; Kegel, I. ; Metzger, T. H. ; Wiebach, Th ; Schmidt, O. G. ; Eberl, K.Applied physics letters, 2001-09, Vol.79 (10), p.1474-1476 [Periódico revisado por pares]Texto completo disponível |
3 |
Material Type: Artigo
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Study of the effect of dielectric porosity on the stress in advanced Cu/low- k interconnects using x-ray diffractionWilson, C. J. ; Zhao, C. ; Zhao, L. ; Metzger, T. H. ; Tőkei, Zs ; Croes, K. ; Pantouvaki, M. ; Beyer, G. P. ; Horsfall, A. B. ; O'Neill, A. G.Applied physics letters, 2009-05, Vol.94 (18), p.181914-181914-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
4 |
Material Type: Artigo
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Structure and ordering of GaN quantum dot multilayersChamard, V. ; Metzger, T. H. ; Bellet-Amalric, E. ; Daudin, B. ; Adelmann, C. ; Mariette, H. ; Mula, G.Applied physics letters, 2001-09, Vol.79 (13), p.1971-1973 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
5 |
Material Type: Artigo
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Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffractionKegel, I. ; Metzger, T. H. ; Peisl, J. ; Schittenhelm, P. ; Abstreiter, G.Applied physics letters, 1999-05, Vol.74 (20), p.2978-2980 [Periódico revisado por pares]Texto completo disponível |
6 |
Material Type: Artigo
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Zero-strain GaAs quantum dot molecules as investigated by x-ray diffuse scatteringHanke, M. ; Schmidbauer, M. ; Grigoriev, D. ; Schäfer, P. ; Köhler, R. ; Metzger, T. H. ; Wang, Zh M. ; Mazur, Yu I. ; Salamo, G. J.Applied physics letters, 2006-07, Vol.89 (5), p.053116-053116-3 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
7 |
Material Type: Artigo
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Diffuse x-ray rods and scattering from point defect clusters in ion implanted siliconBeck, U. ; Metzger, T. H. ; Peisl, J. ; Patel, J. R.Applied physics letters, 2000-05, Vol.76 (19), p.2698-2700 [Periódico revisado por pares]Texto completo disponível |
8 |
Material Type: Artigo
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Anomalous x-ray diffraction on InAs/GaAs quantum dot systemsSchülli, T. U. ; Sztucki, M. ; Chamard, V. ; Metzger, T. H. ; Schuh, D.Applied physics letters, 2002-07, Vol.81 (3), p.448-450 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
9 |
Material Type: Artigo
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Strain states in a quantum well embedded into a rolled-up microtube:X-ray and photoluminescence studiesDeneke, Ch ; Malachias, A. ; Kiravittaya, S. ; Benyoucef, M. ; Metzger, T. H. ; Schmidt, O. G.Applied physics letters, 2010-04, Vol.96 (14), p.143101-143101-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
10 |
Material Type: Artigo
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NONSPECULAR X-RAY-SCATTERING FROM THE AMORPHOUS STATE IN W/C MULTILAYERSJIANG, XM ; METZGER, TH ; PEISL, JApplied physics letters, 1992-08, Vol.61 (8), p.904-906 [Periódico revisado por pares]WOODBURY: Amer Inst PhysicsTexto completo disponível |