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Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography
Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography
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Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography

Rastelli, Armando ; Stoffel, Mathieu ; Malachias, Angelo ; Merdzhanova, Tsvetelina ; Katsaros, Georgios ; Kern, Klaus ; Metzger, Till H ; Schmidt, Oliver G

Nano letters, 2008-05, Vol.8 (5), p.1404-1409 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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Strain distribution in nitride quantum dot multilayers
Strain distribution in nitride quantum dot multilayers
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Strain distribution in nitride quantum dot multilayers

Chamard, V. ; Schülli, T ; Sztucki, M. ; Metzger, T. H. ; Sarigiannidou, E. ; Rouvière, J.-L. ; Tolan, M. ; Adelmann, C. ; Daudin, B.

Physical review. B, Condensed matter and materials physics, 2004-03, Vol.69 (12), Article 125327 [Periódico revisado por pares]

American Physical Society

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3
Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis
Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis
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Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysis

Richard, M.-I. ; Malachias, A. ; Rouvière, J.-L. ; Yoon, T.-S. ; Holmström, E. ; Xie, Y.-H. ; Favre-Nicolin, V. ; Holý, V. ; Nordlund, K. ; Renaud, G. ; Metzger, T.-H.

Physical review. B, Condensed matter and materials physics, 2011-08, Vol.84 (7), Article 075314

United States: American Physical Society

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4
Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping
Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping
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Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping

SCHIILLI, T. U ; STOFFEL, M ; HESSE, A ; STANGL, J ; LECHNER, R. T ; WINTERSBERGER, E ; SZTUCKI, M ; METZGER, T. H ; SCHMIDT, O. G ; BAUER, G

Physical review. B, Condensed matter and materials physics, 2005-01, Vol.71 (3), p.035326.1-035326.9, Article 035326

Ridge, NY: American Physical Society

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5
Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam
Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam
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Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam

Diaz, A. ; Mocuta, C. ; Stangl, J. ; Mandl, B. ; David, C. ; Vila-Comamala, J. ; Chamard, V. ; Metzger, T. H. ; Bauer, G.

Physical review. B, Condensed matter and materials physics, 2009-03, Vol.79 (12), Article 125324

American Physical Society

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6
Single crystal X-ray study of the superstructure modulation and long-range order in V2D
Single crystal X-ray study of the superstructure modulation and long-range order in V2D
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Single crystal X-ray study of the superstructure modulation and long-range order in V2D

Metzger, H. ; Jo, H. ; Moss, S. C. ; Westlake, D. G.

Physica status solidi. A, Applied research, 1978-06, Vol.47 (2), p.631-638

Berlin: WILEY-VCH Verlag

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7
Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance Microscopy
Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance Microscopy
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Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance Microscopy

Huan Li ; Chun-Sheng Jiang ; Metzger, Wyatt K. ; Chih-Kang Shih ; Al-Jassim, Mowafak

IEEE journal of photovoltaics, 2015-01, Vol.5 (1), p.395-400 [Periódico revisado por pares]

Piscataway: IEEE

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8
Coherent X-Ray Scattering Phenomenon in Highly Disordered Epitaxial AlN Films
Coherent X-Ray Scattering Phenomenon in Highly Disordered Epitaxial AlN Films
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Coherent X-Ray Scattering Phenomenon in Highly Disordered Epitaxial AlN Films

Metzger, T. ; Höpler, R. ; Born, E. ; Christiansen, S. ; Albrecht, M. ; Strunk, H. P. ; Ambacher, O. ; Stutzmann, M. ; Stömmer, R. ; Schuster, M. ; Göbel, H.

Physica status solidi. A, Applied research, 1997-08, Vol.162 (2), p.529-535

Berlin: WILEY-VCH Verlag

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