Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based NanotomographyRastelli, Armando ; Stoffel, Mathieu ; Malachias, Angelo ; Merdzhanova, Tsvetelina ; Katsaros, Georgios ; Kern, Klaus ; Metzger, Till H ; Schmidt, Oliver GNano letters, 2008-05, Vol.8 (5), p.1404-1409 [Periódico revisado por pares]Washington, DC: American Chemical SocietyTexto completo disponível |
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2 |
Material Type: Artigo
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Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometryDiaz, Ana ; Mocuta, Cristian ; Stangl, Julian ; Keplinger, Mario ; Weitkamp, Timm ; Pfeiffer, Franz ; David, Christian ; Metzger, Till H. ; Bauer, GüntherJournal of synchrotron radiation, 2010-05, Vol.17 (3), p.299-307 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
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3 |
Material Type: Artigo
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Three-dimensional diffraction mapping by tuning the X-ray energyCornelius, T. W. ; Carbone, D. ; Jacques, V. L. R. ; Schülli, T. U. ; Metzger, T. H.Journal of synchrotron radiation, 2011-05, Vol.18 (3), p.413-417 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
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4 |
Material Type: Artigo
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Early stage of ripple formation on Ge(001) surfaces under near-normal ion beam sputteringCarbone, D ; Alija, A ; Plantevin, O ; Gago, R ; Facsko, S ; Metzger, T HNanotechnology, 2008-01, Vol.19 (3), p.035304-035304 (5) [Periódico revisado por pares]England: IOP PublishingTexto completo disponível |
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5 |
Material Type: Artigo
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In situ three-dimensional reciprocal-space mapping during mechanical deformationCornelius, T. W. ; Davydok, A. ; Jacques, V. L. R. ; Grifone, R. ; Schülli, T. ; Richard, M.-I. ; Beutier, G. ; Verdier, M. ; Metzger, T. H. ; Pietsch, U. ; Thomas, O.Journal of synchrotron radiation, 2012-09, Vol.19 (5), p.688-694 [Periódico revisado por pares]5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of CrystallographyTexto completo disponível |
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6 |
Material Type: Artigo
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Multiple scattering effects in strain and composition analysis of nanoislands by grazing incidence x raysRichard, M.-I. ; Favre-Nicolin, V. ; Renaud, G. ; Schülli, T. U. ; Priester, C. ; Zhong, Z. ; Metzger, T.-H.Applied physics letters, 2009-01, Vol.94 (1), p.013112-1-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
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7 |
Material Type: Artigo
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Study of the effect of dielectric porosity on the stress in advanced Cu/low- k interconnects using x-ray diffractionWilson, C J ; Zhao, C ; Zhao, L ; Metzger, T H ; Tőkei, Zs ; Croes, K ; Pantouvaki, M ; Beyer, G P ; Horsfall, A B ; O'Neill, A GApplied physics letters, 2009-05, Vol.94 (18), p.181914-181914-3 [Periódico revisado por pares]American Institute of PhysicsTexto completo disponível |
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8 |
Material Type: Artigo
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Shape, strain, and ordering of lateral InAs quantum dot moleculesKRAUSE, B ; METZGER, T. H ; RASTELLI, A ; SONGMUANG, R ; KIRAVITTAYA, S ; SCHMIDT, O. GPhysical review. B, Condensed matter and materials physics, 2005-08, Vol.72 (8), p.085339.1-085339.12, Article 085339 [Periódico revisado por pares]Ridge, NY: American Physical SocietyTexto completo disponível |
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9 |
Material Type: Artigo
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Direct strain and elastic energy evaluation in rolled-up semiconductor tubes by x-ray microdiffractionMalachias, A. ; Deneke, Ch ; Krause, B. ; Mocuta, C. ; Kiravittaya, S. ; Metzger, T. H. ; Schmidt, O. G.Physical review. B, Condensed matter and materials physics, 2009-01, Vol.79 (3), Article 035301 [Periódico revisado por pares]Texto completo disponível |
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10 |
Material Type: Artigo
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Strain distribution in nitride quantum dot multilayersChamard, V. ; Schülli, T ; Sztucki, M. ; Metzger, T. H. ; Sarigiannidou, E. ; Rouvière, J.-L. ; Tolan, M. ; Adelmann, C. ; Daudin, B.Physical review. B, Condensed matter and materials physics, 2004-03, Vol.69 (12), Article 125327 [Periódico revisado por pares]American Physical SocietyTexto completo disponível |